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GRM2195C1H562JA01D 参数 Datasheet PDF下载

GRM2195C1H562JA01D图片预览
型号: GRM2195C1H562JA01D
PDF下载: 下载PDF文件 查看货源
内容描述: 片状独石陶瓷电容器 [Chip Monolithic Ceramic Capacitors]
分类和应用: 电容器陶瓷电容器
文件页数/大小: 221 页 / 4341 K
品牌: MURATA [ muRata ]
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• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our  
C02E.pdf  
!Note  
sales representatives or product engineers before ordering.  
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.  
10.12.20  
GMA Series Specifications and Test Methods (2)  
When no "*" is added in PNs table, please refer to GMA Series Specifications and Test Methods (1).  
When "*" is added in PNs table, please refer to GMA Series Specifications and Test Methods (2).  
No.  
1
Item  
Operating  
Temperature  
Range  
Specifications  
Test Method  
R6 : –55°C to 85°C  
Reference Temperature : 25°C  
The rated voltage is defined as the maximum voltage that may  
be applied continuously to the capacitor.  
2
Rated Voltage  
See the previous pages.  
When AC voltage is superimposed on DC voltage, VP-P or VO-P  
,
whichever is larger, should be maintained within the rated volt-  
age range.  
3
4
Appearance  
Dimensions  
No defects or abnormalities.  
Visual inspection.  
Using calipers.  
Within the specified dimensions.  
No failure should be observed when 250% of the rated voltage  
is applied between the terminations for 1 to 5 seconds, provid-  
ed the charge/discharge current is less than 50mA.  
5
Dielectric Strength No defects or abnormalities.  
The insulation resistance should be measured with a DC  
voltage not exceeding the rated voltage at normal temperature  
and humidity and within 1 minutes of charging.  
Insulation  
6
7
8
More than 50· F  
Resistance  
Capacitance  
Within the specified tolerance.  
R6 : 0.1 max.  
The capacitance/D.F. should be measured at reference  
temperature at the frequency and voltage shown in the table.  
Dissipation  
Factor (D.F.)  
Capacitance  
Frequency  
Voltage  
CV10µF (6.3Vmax.)  
1±0.1kHz  
0.5±0.1Vrms  
The capacitance change should be measured after 5 min. at  
each specified temp. stage.  
The ranges of capacitance change compared with the  
Reference Temperature value over the temperature ranges  
shown in the table should be within the specified ranges.*  
Step  
Temperature (°C)  
25±2  
Capacitance  
1
2
3
4
9
Temperature  
No bias R6 : Within ±15% (–55°C to +85°C)  
–55±3  
25±2  
85±3  
Characteristics  
*Initial measurement for high dielectric constant type  
Perform a heat treatment at 150 +0/–10°C for one hour and  
then let sit for 24±2 hours at room temperature.  
Perform the initial measurement.  
MIL-STD-883 Method 2011 Condition D  
Bond  
Mount the capacitor on a gold metallized alumina substrate with  
Au-Sn (80/20) and bond a 25µm (0.001 inch) gold wire to the  
capacitor terminal using an ultrasonic ball bond. Then, pull wire.  
Pull force : 0.03N min.  
Strength  
Mechanical  
Strength  
10  
11  
MIL-STD-883 Method 2019  
Mount the capacitor on a gold metallized alumina substrate  
with Au-Sn (80/20). Apply the force parallel to the substrate.  
Die Shear  
Die Shear force : 2N min.  
Strength  
Appearance No defects or abnormalities.  
Capacitance Within the specified tolerance.  
Ramp frequency from 10 to 55Hz then return to 10Hz all within  
1 minute. Amplitude: 1.5 mm (0.06 inch) max. total excursion.  
Apply this motion for a period of 2 hours in each of 3 mutually  
perpendicular directions (total 6 hours).  
Vibration  
Resistance  
D.F.  
R6 : 0.1 max.  
Appearance No defects or abnormalities.  
The capacitor should be set for 24±2 hours at room  
temperature after one hour of heat treatment at 150+0/–10°C,  
then measure for the initial measurement. Fix the capacitor to  
the supporting jig in the same manner and under the same  
conditions as (11) and conduct the five cycles according to the  
temperatures and time shown in the following table. Set it for  
48±4 hours at room temperature, then measure.  
Capacitance  
R6 : Within ±7.5%  
Change  
D.F.  
I.R.  
R6 : 0.1 max.  
Temperature  
12 Sudden  
Change  
More than 50· F  
Step  
1
2
3
4
Min.  
Max.  
Dielectric  
Strength  
Room  
Temp.  
Room  
Temp.  
No defects  
Temp. (°C) Operating  
Operating  
Temp. +3/–0  
30±3  
Temp.+0/–3  
Time (min.)  
30±3  
2 to 3  
2 to 3  
Mounting for testing: The capacitors should be mounted on the substrate as shown below using die bonding and wire bonding when tests No. 11 to 14 are performed.  
Continued on the following page.  
117