Item
Specification
Test Method (Ref. Standard:JIS C 5101, IEC60384)
Solder the capacitor on the test substrate shown in Fig.3.
No.
15 High
Appearance No defects or abnormalities.
40+/-2℃
Temperature
High Humidity
(Steady)
Test Temperature :
Test Humidity :
Test Time :
Capacitance Within +/-12.5%
Change
90%RH to 95%RH
500+/-12h
Q or D.F.
DF:0.1 max.
Test Voltage :
Charge/Discharge Current :
Rated Voltage
50mA max.
I.R.
More than 500MΩ or 25Ω･F (Whichever is smaller)
Let sit for 24+/-2hours at room temperature, then measure.
Post-treatment :
16 Durability
Appearance No defects or abnormalities.
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature :
Test Time :
Test Voltage :
Maximum Operating Temperature+/-3℃
1000+/-12h
100% of the rated voltage
50mA max.
Capacitance Within +/-12.5%
Change
Charge/Discharge Current :
Q or D.F.
DF:0.1 max.
Apply the test voltage at the test temperature for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Let sit for 24+/-2hours at room temperature, then measure.
I.R.
More than 1000MΩ or 50Ω･F (Whichever is smaller)
Pre-treatment :
Post-treatment :
Derating conditions on Voltage and Temperature (for Rated Voltage 100Vdc max.)
Derated products*1 are suitable for use in circuits w here continuous applied voltage and temperature to the
capacitor is derated (below rated voltage and temperature).
A reliability assurance level equivalent to standard products*2 can be secured by restricting the voltage and
temperature according to the derating conditions in the chart.
*1 Derated Products: The test voltage of these products is less than 150% of the rated voltage
in the Durability / Operational Life Test.
*2 Standard Products: The test voltage of these products is 150% of the rated voltage and over
in the Durability / Operational Life Test.
GRM188R61H684KA75-01A
MURATA [ muRata ]
