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C02E.pdf
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• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering0. 9.9.18
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
GA3 Series Specifications and Test Methods
Continued from the preceding page.
Specifications
No.
Item
Test Method
Fix the capacitor to the supporting jig (glass epoxy board) shown
Appearance
No marking defects
in Fig. 4.
Perform the 5 cycles according to the 4 heat treatments listed in
the following table.
Let sit for 24T2 hrs. at room condition* , then measure.
Char.
X7R
Capacitance Change
Within T15%
Within T2.5% or T0.25pF
(Whichever is larger)
Capacitance
Change
1
SL
Time (min.)
30T3
2 to 3
30T3
2 to 3
Temperature (D)
Min. Operating Temp.T3
Room Temp.
Max. Operating Temp.T2
Room Temp.
Step
1
2
3
4
Char.
X7R
Specification
D.F.
Q
D.F.V0.05
2
QU400W20C* (CF30pF)
Temperature
Cycle
SL
16
QU1000
(CU30pF)
#Pretreatment for X7R char.
Perform a heat treatment at 150
W00
Y10
D for 60T5 min. and then
I.R.
More than 3,000MΩ
1
let sit for 24T2 hrs. at room condition* .
Dielectric
Strength
Solder resist
Cu
In accordance with item No.4
No marking defects
Glass Epoxy Board
Fig. 4
Appearance
Char.
X7R
Capacitance Change
Before this test, the test shown in the following is performed.
·Item 11 Adhesive Strength of Termination (applied force is 5N)
·Item 13 Deflection
Capacitance
Change
Within T15%
Within T5.0% or T0.5pF
(Whichever is larger)
SL
Let the capacitor sit at 40T2D and relative humidity of 90 to 95%
W24
Humidity
17 (Steady
State)
for 500
hrs.
Char.
X7R
Specification
Y00
1
D.F.
Q
D.F.V0.05
Remove and let sit for 24T2 hrs. at room condition* , then
2
QU275W5/2C* (CF30pF)
measure.
SL
QU350
(CU30pF)
#Pretreatment for X7R char.
Perform a heat treatment at 150
W00
Y10
D for 60T5 min. and then
1
I.R.
More than 3,000MΩ
let sit for 24T2 hrs. at room condition* .
Dielectric
Strength
In accordance with item No.4
No marking defects
Before this test, the test shown in the following is performed.
·Item 11 Adhesive Strength of Termination (apply force is 5N)
·Item 13 Deflection
Appearance
Char.
X7R
Capacitance Change
Within T20%
Within T3.0% or T0.3pF
(Whichever is larger)
Capacitance
Change
Front time (T1)=1.2µs=1.67T
Impulse Voltage
Time to half-value (T2)
(%)
=50µs
SL
Each individual capacitor should
be subjected to a 2.5kV (Type
GC/GF: 5kV) Impulse (the
voltage value means zero to
peak) for three times. Then the
capacitors are applied to life test.
100
90
50
30
Char.
X7R
Specification
0
t
D.F.
Q
D.F.V0.05
T
2
T1
QU275W5/2C* (CF30pF)
SL
T2
QU350
(CU30pF)
W2
Y0
Apply voltage as Table for 1,000 hrs. at 125
humidity 50% max.
D, relative
18 Life
I.R.
More than 3,000MΩ
Type
Applied Voltage
AC312.5V (r.m.s.), except that once each hour the
voltage is increased to AC1,000V (r.m.s.) for 0.1 sec.
GB
GC
GD
GF
AC425V (r.m.s.), except that once each hour the
voltage is increased to AC1,000V (r.m.s.) for 0.1 sec.
Dielectric
Strength
In accordance with item No.4
1
Let sit for 24T2 hrs. at room condition* , then measure.
#Pretreatment for X7R char.
Perform a heat treatment at 150
W00
Y10
D for 60T5 min. and then
1
let sit for 24T2 hrs. at room condition* .
*1 "Room condition" Temperature: 15 to 35D, Relative humidity: 45 to 75%, Atmospheric pressure: 86 to 106kPa
*2 "C" expresses nominal capacitance value (pF).
18
Continued on the following page.
198