■ Specifications and Test Methods
No Item
16 Durability
Specification
Test Method(Ref. Standard:JIS C 5101, IEC60384）
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-0.3pF
Q≧200+10C C:Nominal Capacitance(pF)
More than 1000MΩ
Mounting method
Test Temperature
Test Time
Solder the capacitor on the test substrate
Maximum Operating Temperature +/-3℃
1000+/-12h
I.R.
Test Voltage
200% of the rated voltage
Charge/discharge current 50mA max.
Post-treatment
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
Measurement Temperature
300mΩ below
Room Temperature
17 ESR
Measurement Frequency 1.0+/-0.1GHz
Measurement Instrument Equivalent to E4991
GJM0225C1C8R8DB01-01A
4
MURATA [ muRata ]
