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GCM3195C1H752FA16# 参数 Datasheet PDF下载

GCM3195C1H752FA16#图片预览
型号: GCM3195C1H752FA16#
PDF下载: 下载PDF文件 查看货源
内容描述: [汽车[动力总成 / 安全设备],汽车[信息娱乐 / 舒适设备],植入式以外的医疗器械设备 [GHTF A/B/C]]
分类和应用: 医疗医疗器械
文件页数/大小: 31 页 / 1820 K
品牌: MURATA [ muRata ]
 浏览型号GCM3195C1H752FA16#的Datasheet PDF文件第1页浏览型号GCM3195C1H752FA16#的Datasheet PDF文件第2页浏览型号GCM3195C1H752FA16#的Datasheet PDF文件第4页浏览型号GCM3195C1H752FA16#的Datasheet PDF文件第5页浏览型号GCM3195C1H752FA16#的Datasheet PDF文件第6页浏览型号GCM3195C1H752FA16#的Datasheet PDF文件第7页浏览型号GCM3195C1H752FA16#的Datasheet PDF文件第8页浏览型号GCM3195C1H752FA16#的Datasheet PDF文件第9页  
Specifications and Test Methods  
No Item  
6 Biased Humidity  
Specification  
Test MethodRef. Standard:AEC-Q200)  
Solder the capacitor on the test substrate  
85+/-3℃  
80%RH to 85%RH  
Appearance  
No defects or abnormalities.  
Within +/-3%  
Mounting method  
Test Temperature  
Test Humidity  
Test Time  
Capacitance Change  
Q or D.F.  
I.R.(Room Temp.)  
Q200  
More than 1000MΩ  
1000+/-12h  
Test Voltage  
The rated voltage and 1.3+0.2/-0Vdc (add 6.8kΩ resister)  
Charge/discharge current 50mA max.  
Post-treatment  
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.  
Appearance  
Capacitance Change  
Q or D.F.  
No defects or abnormalities.  
Within +/-3%  
Q350  
Mounting method  
Test Temperature  
Test Time  
Solder the capacitor on the test substrate  
Maximum Operating Temperature +/-3℃  
1000+/-12h  
7 Operational Life  
I.R.(Room Temp.)  
More than 1000MΩ  
Test Voltage  
200% of the rated voltage  
Charge/discharge current 50mA max.  
Post-treatment  
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.  
No defects or abnormalities.  
Shown in Dimension.  
Visual inspection  
8 Appearance  
Using Measuring instrument of dimension.  
Per MIL-STD-202 Method 215  
9 Dimension  
Appearance  
Capacitance  
Q or D.F.  
No defects or abnormalities.  
10 Resistance to Solvents  
Within the specified initial value.  
Within the specified initial value.  
More than 10000MΩ  
I.R.(Room Temp.)  
Appearance  
Capacitance  
Q or D.F.  
No defects or abnormalities.  
Within the specified initial value.  
Within the specified initial value.  
More than 10000MΩ  
Mounting method  
Waveform  
Peak value  
Solder the capacitor on the test substrate  
Half-sine  
1500g  
0.5ms  
11 Mechanical Shock  
I.R.(Room Temp.)  
Holding Time  
Velocity change  
Shocks directions and times  
4.7m/s  
Three shocks in each direction should be applied along 3  
mutually perpendicular axes of the test specimen (18 shocks).  
Appearance  
Capacitance  
Q or D.F.  
No defects or abnormalities.  
Within the specified initial value.  
Within the specified initial value.  
More than 10000MΩ  
Mounting method  
Kind of Vibration  
Vibration Time  
Solder the capacitor on the test substrate  
A 10Hz to 2000Hz to 10Hz  
20min  
1.5mm  
12 Vibration  
I.R.(Room Temp.)  
Total amplitude  
Vibration directions and time  
This motion should be applied for 12 items in each 3 mutually perpendicular directions  
(total of 36 times).  
Appearance  
Capacitance or Capacitance Change  
No defects or abnormalities.  
Test Method  
Solder bath method  
Sn-3.0Ag-0.5Cu(Lead Free Solder)  
260+/-5℃  
10+/-1s  
13 Resistance to Soldering  
Heat  
Capacitance:Within the specified initial value.  
Within the specified initial value.  
More than 10000MΩ  
Kind of Solder  
Test Temperature  
Test Time  
Q or D.F.  
I.R.(Room Temp.)  
Post-treatment  
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.  
Appearance  
Capacitance  
Q or D.F.  
No defects or abnormalities.  
Within the specified initial value.  
Within the specified initial value.  
More than 10000MΩ  
Per AEC-Q200-002  
14 ESD  
I.R.(Room Temp.)  
GCM3195C1H752FA16-01A  
3
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