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K1100BACEM-70.000MHZ 参数 Datasheet PDF下载

K1100BACEM-70.000MHZ图片预览
型号: K1100BACEM-70.000MHZ
PDF下载: 下载PDF文件 查看货源
内容描述: [CMOS Output Clock Oscillator, 70MHz Nom, DIL-14/4]
分类和应用: 机械振荡器
文件页数/大小: 2 页 / 370 K
品牌: MTRONPTI [ MTRONPTI ]
 浏览型号K1100BACEM-70.000MHZ的Datasheet PDF文件第1页  
K1100BA, K1150BA, K1125BA, K1110BA Series
14 pin DIP, 5.0 Volt, Clock Oscillator
OBSOLETE
K1100BA Series
PIN
1
2
3
4
FUNCTION
N/C / Tri-State
Ground
Output
+ VCC
THIS PRODUCT IS NOT RECOMMENDED FOR NEW DESIGNS.
5V Crystal Clock Oscillators
PLEASE REFER TO THE MHO+ PRODUCT SERIES.
SHIPPING TUBE CROSS SECTION
OUTPUT WAVEFORM
TEST CIRCUIT DIAGRAM
MECHANICAL AND ENVIRONMENTAL SPECIFICATIONS
TEST METHODS
Temperature Cycle
Mechanical Shock
Vibration
Humidity Steady State
Thermal Shock
Electrostatic Discharge
Solderability
Hermeticity
Resistance to Soldering
Lead Integrity
Marking Permanence
Life Test
REFERENCE PROCEDURES
MIL-STD-833, Mtd 1010, Cond. B
MIL-STD-883, Mtd 2002, Cond. B
MIL-STD 883, Mtd 2007, Cond. B
MIL-STD-202, Mtd 103
MIL-STD-883, Mtd 1011.7 Cond. B
MIL-STD-883, Mtd 3015 Class II
MIL-STD-883, Mtd 2022.2
MIL-STD-883, Mtd 1014.8, Cond. A1
DESCRIPTION
-55°C to +125°C; Air-to-Air; 100 cycles; 10
min. dwell
1500 g’’s
20-2000 Hz; 0.06 inch; 15g’’s; 3 planes
40°C; 90%-95% R.H.; 56 days
100°C to 0°C; Water-to-Water; 15 cycles
2 KV to 4 KV Threshold
Solder dip; Meniscograph Criteria
Mass spectro. 2 x 10-8 atmos. CC/sec He
MIL-STD-202, Mtd 210D, Cond. J
235°C; 30 seconds
MIL-STD-883, Mtd 2004.5, Cond. A, B1 Lead tension & bend stress
MIL-STD-883, Mtd 2015.8
MIL-STD-883, Mtd 1005.6
Resistance to solvents
125
°C, powered, 1000 hours minimum
2553 N. Edgington Street, Franklin Park, IL 60131
Phone: 847.451.1000 Fax: 847.451.7585
Please see
www.mtronpti.com  for  our  complete  offering  and  detailed  datasheets.  Contact  us  for  your  application  specific  requirements:  MtronPTI  1-800-762-8800.
800-888-1499 or www.champtech.com
MtronPTI reserves the right to make changes to the product(s) and service(s) described herein without notice. No liability is assumed as a result of their use or application.
Revision:  03-­01-­07
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