MC7800, MC7800A, LM340, LM340A Series
ELECTRICAL CHARACTERISTICS (continued)
(Vin = 10 V, IO = 1.0 A, TJ = Tlow to Thigh [Note 1], unless otherwise noted.)
MC7805AC/LM340AT–5
Characteristic
Output Noise Voltage (TA = 25°C)
10 Hz
≤
f
≤
100 kHz
Output Resistance (f = 1.0 kHz)
Short Circuit Current Limit (TA = 25°C)
Vin = 35 Vdc
Peak Output Current (TJ = 25°C)
Average Temperature Coefficient of Output Voltage
Symbol
Vn
rO
ISC
Imax
TCVO
Min
–
–
–
–
–
Typ
10
0.9
0.2
2.2
–0.3
Max
–
–
–
–
–
Unit
µV/V
O
mΩ
A
A
mV/°C
NOTES:
1. Tlow = –40°C for MC78XXAC, C, LM340AT–XX, LM340T–XX
Thigh = +125°C for MC78XXAC, C, LM340AT–XX, LM340T–XX
2. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account
separately. Pulse testing with low duty cycle is used.
ELECTRICAL CHARACTERISTICS
(Vin = 11 V, IO = 500 mA, TJ = Tlow to Thigh [Note 1], unless otherwise noted.)
MC7806C
Characteristic
Output Voltage (TJ = 25°C)
Output Voltage (5.0 mA
≤
IO
≤
1.0 A, PD
≤
15 W)
8.0 Vdc
≤
Vin
≤
21 Vdc
9.0 Vdc
≤
Vin
≤
21 Vdc
Line Regulation, TJ = 25°C (Note 2)
8.0 Vdc
≤
Vin
≤
25 Vdc
9.0 Vdc
≤
Vin
≤
13 Vdc
Load Regulation, TJ = 25°C (Note 2)
5.0 mA
≤
IO
≤
1.5 A
Quiescent Current (TJ = 25°C)
Quiescent Current Change
8.0 Vdc
≤
Vin
≤
25 Vdc
5.0 mA
≤
IO
≤
1.0 A
Ripple Rejection
9.0 Vdc
≤
Vin
≤
19 Vdc, f = 120 Hz
Dropout Voltage (IO = 1.0 A, TJ = 25°C)
Output Noise Voltage (TA = 25°C)
10 Hz
≤
f
≤
100 kHz
Output Resistance f = 1.0 kHz
Short Circuit Current Limit (TA = 25°C)
Vin = 35 Vdc
Peak Output Current (TJ = 25°C)
Average Temperature Coefficient of Output Voltage
Symbol
VO
VO
5.7
–
Regline
–
–
Regload
IB
∆I
B
–
–
RR
VI – VO
Vn
rO
ISC
Imax
TCVO
58
–
–
–
–
–
–
0.3
0.08
65
2.0
10
0.9
0.2
2.2
–0.3
1.3
0.5
–
–
–
–
–
–
–
dB
Vdc
µV/V
O
mΩ
A
A
mV/°C
–
–
0.5
0.8
1.3
3.3
24
12
30
8.0
mV
mA
mA
6.0
–
6.3
–
mV
Min
5.75
Typ
6.0
Max
6.25
Unit
Vdc
Vdc
NOTES:
1. Tlow = –40°C for MC78XXAC, C
Thigh = +125°C for MC78XXAC, C
2. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account
separately. Pulse testing with low duty cycle is used.
4
MOTOROLA ANALOG IC DEVICE DATA