V62C1802048L(L)
Data Retention Characteristics (L Version Only)(1)
Parameter
Symbol
VDR
Test Condition
Min Max Unit
-
V
for Data Retention
CE > VCC - 0.2V or
1.0
V
CC
1
Data Retention Current
ICCDR
CE < + 0.2V
1
mA
2
Chip Deselect to Data Retention Time
Operation Recovery Time(2)
tCDR
tR
VIN > VCC - 0.2V or
VIN < 0.2V
0
-
-
ns
ns
t
RC
Data Retention Waveform (L Version Only) (TA = 00C to +700C / -400C to +850C)
Data Retention Mode
VCC
Vcc_typ
V
>
1.0V
Vcc_typ
DR
tCDR
tR
CE
V
V
V
IH
DR
IH
Notes
1. L-version includes this feature.
2. This Parameter is samples and not 100% tested.
3. For test conditions, see AC Test Condition, Figure A.
4. This parameter is tested with CL = 5pF as shown in Figure B. Transition is measured + 500mV from steady-state voltage.
5. This parameter is guaranteed, but is not tested.
6. WE is HIGH for read cycle.
7. CE1 and OE are LOW and CE2 is HIGH for read cycle.
8. Address valid prior to or coincident with CE1 transition LOW or CE2 transition HIGH.
9. All read cycle timings are referenced from the last valid address to the first transtion address.
10. CE1 or WE must be HIGH or CE2 must be LOW during address transition.
11. All write cycle timings are referenced from the last valid address to the first transition address.
7
REV. 1.2 May 2001 V62C1802048L(L)