MO SEL VITELIC
V53C516405A
If they were not equal, the I/O would indicate a “0”.
The WCBR cycle (WE, CAS before RAS) puts the
device into test mode. To exit from test mode, a
“CAS before RAS refresh”, “RAS only refresh” or
“Hidden refresh” can be used.Refresh during test
mode operation can be performed by normal read
cycles or by WCBR refresh cycles.
Row addresses A0 through A9 have to kept high
to perform a testmode entry cycle. All other address-
es are don’t care.
Test Mode
As the V53C516405A is organized internally as
1M x 16-bits, a test mode cycle using 4:1 compres-
sion can be used to improve test time. Note that in
the 4M x 4 version the test time is reduced by 1/4 for
a N test pattern.
In a test mode “write” the data from each I/O pin is
written into four 1M blocks simultaneously (all “1” s
or all “0” s). In test mode “read” each I/O output is
used for indicating the test mode result. If the inter-
nal four bits are equal, the I/O would indicate a “1”.
Block Diagram in Test Mode
A0C,A1C
A0C,A1C
1 M Block
Vcc
Normal
1 M Block
Normal
I/O 1
I/O 1
1 M Block
Test
Test
1 M Block
Vss
Vcc
A0C,A1C
A0C,A1C
1 M Block
Normal
Normal
1 M Block
I/O 2
I/O 2
1 M Block
Test
Test
1 M Block
Vss
Vcc
A0C,A1C
A0C,A1C
1 M Block
Normal
1 M Block
Normal
I/O 3
1 M Block
Test
I/O 3
Test
1 M Block
Vss
Vcc
A0C,A1C
A0C,A1C
1 M Block
Normal
1 M Block
Normal
I/O 4
I/O 4
Vss
1 M Block
Test
Test
1 M Block
V53C516405A Rev. 1.1 March 1998
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