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MFM8126VI-70 参数 Datasheet PDF下载

MFM8126VI-70图片预览
型号: MFM8126VI-70
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash, 128KX8, 70ns, CDXA32, 0.100 INCH, CERAMIC, VIL-32]
分类和应用: 内存集成电路
文件页数/大小: 27 页 / 326 K
品牌: MOSAIC [ MOSAIC ]
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ISSUE 4.2:November1998  
MFM8126S-70/90/12  
Screening  
Military Screening Procedure  
Component Screening Flow for high reliability product using methods from 5004.  
MB COMPONENT SCREENING FLOW  
SCREEN  
TESTMETHOD  
LEVEL  
Mechanical  
Temperature cycle  
Constant acceleration  
Pre-Burn-in electrical  
Burn-in  
1010 Condition C (10 Cycles,-65°C to +150°C)  
2001 Condition D (Y, only) (20,000g)  
100%  
100%  
100%  
100%  
Per applicable device specifications at TA=+25°C  
Method 1015,Condition D,TA=+125°C,160hrs min  
Endurance  
As per internal specification  
Write Cycle endurance and  
Data Retention performance  
Final Electrical Tests  
Per applicable Device Specification  
Static (dc)  
a) @ TA=+25°C and power supply extremes  
b) @ temperature and power supply extremes  
100%  
100%  
Functional  
a) @ TA=+25°C and power supply extremes  
b) @ temperature and power supply extremes  
100%  
100%  
Switching (ac)  
a) @ TA=+25°C and power supply extremes  
b) @ temperature and power supply extremes  
100%  
100%  
Percent Defective allowable (PDA)  
Hermeticity  
Calculated at post-burn-in at TA=+25°C  
5%  
1014  
Fine  
Gross  
Condition A  
Condition C  
100%  
100%  
External Visual  
2009 Per vendor or customer specification  
100%  
26  
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