UVEPROM
SMJ27C512
AS27C512
Austin Semiconductor, Inc.
CAPACITANCE OVER RECOMMENDED RANGES OF SUPPLY VOLTAGE AND
OPERATING CASE TEMPERATURE, f = 1MHz*
PARAMETER
TEST CONDITIONS TYP**
UNIT
6
pF
CI
VI = 0V
VO = 0V
Input capacitance
10
20
pF
pF
CO
Output capacitance
CG/VPP G\ /VPP input capacitance
G\ /VPP = 0V
* Capacitance measurements are made on sample basis only.
** All typical values are at TC = 25°C and nominal voltages.
SWITCHING CHARACTERISTICS OVER RECOMMENDED RANGES OF SUPPLY
VOLTAGE AND OPERATING CASE TEMPERATURE
TEST
-12
-15
-20
-25
PARAMETER
UNIT
1,2
CONDITIONS
MIN MAX MIN MAX MIN MAX MIN MAX
t
Access time from address
Access time from E\
120
120
35
150
150
45
200
200
60
250
250
100
ns
ns
ns
a(A)
t
a(E)
t
Output enable time from G\ /V
en(G)
PP
See Figure 2
Output disable time from G\ /V or E\,
PP
t
0
0
35
0
0
40
0
0
60
0
0
60
ns
ns
dis
3
whichever occurs first
Output data valid time after change of
t
v(A)
3
address, E\, or G\, whichever occurs first
NOTES:
1. Timing measurements are made at 2V for logic high and 0.8V for logic low. (see Figure 2)
2. Common test conditions apply for tdis except during programming.
3. Value calculated from 0.5V delta to measured output level. This parameter is only sampled and not 100% tested.
RECOMMENDED TIMING REQUIREMENTS FOR PROGRAMMING: VCC = 6.5V and
G\ /VPP = 13V (SNAP! Pulse), TC = 25°C (see Figure 2)
MIN
NOM
MAX
UNIT
tdis(E)
th(A)
0
0
130
ns
µs
Output disable time from E\
Hold Time, address
Hold time, address
Hold time, G\ /VPP
2
2
µs
µs
µs
µs
µs
µs
µs
µs
µs
ns
th(D)
th(VPP)
tw(IPGM)
trec(PG)
tsu(A)
Pulse duration, initial program
Recovery time, G\ /VPP
Setup Time, Address
Setup Time, Data
95
2
100
105
2
2
tsu(D)
Setup Time, G\ /VPP
Setup Time, VCC
2
tsu(Vpp)
tsu(Vcc)
tv(ELD)
tr(PG)
2
Data valid from E\ low
G\ /VPP rise time
1
50
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
SMJ27C512/AS27C512
Rev. 2.5 10/03
7
MICROSS [ MICROSS COMPONENTS ]
