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AS1419F-XT 参数 Datasheet PDF下载

AS1419F-XT图片预览
型号: AS1419F-XT
PDF下载: 下载PDF文件 查看货源
内容描述: [ADC, Successive Approximation, 14-Bit, 1 Func, 1 Channel, Parallel, Word Access, Bipolar, FP-28]
分类和应用: 转换器
文件页数/大小: 19 页 / 424 K
品牌: MICROSS [ MICROSS COMPONENTS ]
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ADC  
AS1419  
AS1419A  
Austin Semiconductor, Inc.  
DYNAMIC PERFORMANCE  
CONVERSION DETAILS  
TheAS1419 has excellent high speed sampling capability.  
FFT (Fast Fourier Transform) test techniques are used to test  
theADC’s frequency response, distortion and noise at the rated  
throughput. By applying a low distortion sine wave and  
analyzing the digital output using an FFT algorithm, theADC’s  
spectral content can be examined for frequencies outside the  
fundamental. Figure 2 shows a typicalAS1419 FFT plot.  
The AS1419 uses a successive approximation algorithm  
and an internal sample-and-hold circuit to convert an analog  
signal to a 14-bit parallel output. The ADC is complete with a  
precision reference and an internal clock. The control logic  
provides easy interface to microprocessors and DSPs (please  
refer to Digital Interface section for the data format).  
Conversion start is controlled by the CS\ and CONVST\  
inputs. At the start of the conversion, the successive  
approximation register (SAR) is reset. Once a conversion cycle  
has begun, it cannot be restarted.  
FIGURE 1: Simplified Block Diagram  
During the conversion, the internal differential 14-bit  
capacitive DAC output is sequenced by the SAR from the most  
significant bit (MSB) to the least significant bit (LSB).  
Referring to Figure 1, the +AIN and –AIN inputs are connected  
to the sample-and-hold capacitors (CSAMPLE) during the  
acquire phase and the comparator offset is nulled by the zero-  
ing switches. In this acquire phase, a minimum delay of 200ns  
will provide enough time for the sample-and-hold capacitors to  
acquire the analog signal. During the convert phase, the  
comparator zeroing switches open, putting the comparator into  
compare mode. The input switches the CSAMPLE capacitors to  
ground, transferring  
the differential analog input charge onto the summing junction.  
This input charge is successively compared with the binary  
weighted charges supplied by the differential capacitive DAC.  
Bit decisions are made by the high speed comparator. At the  
end of a conversion, the differential DAC output balances the  
+AIN and –AIN input charges. The SAR contents (a 14-bit data  
word) which represents the difference of +AIN and –AIN are  
loaded into the 14-bit output latches.  
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.  
AS1419 & AS1419A  
Rev. 0.1 1/04  
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