ADC
AS1419
AS1419A
Austin Semiconductor, Inc.
DYNAMIC PERFORMANCE
CONVERSION DETAILS
TheAS1419 has excellent high speed sampling capability.
FFT (Fast Fourier Transform) test techniques are used to test
theADC’s frequency response, distortion and noise at the rated
throughput. By applying a low distortion sine wave and
analyzing the digital output using an FFT algorithm, theADC’s
spectral content can be examined for frequencies outside the
fundamental. Figure 2 shows a typicalAS1419 FFT plot.
The AS1419 uses a successive approximation algorithm
and an internal sample-and-hold circuit to convert an analog
signal to a 14-bit parallel output. The ADC is complete with a
precision reference and an internal clock. The control logic
provides easy interface to microprocessors and DSPs (please
refer to Digital Interface section for the data format).
Conversion start is controlled by the CS\ and CONVST\
inputs. At the start of the conversion, the successive
approximation register (SAR) is reset. Once a conversion cycle
has begun, it cannot be restarted.
FIGURE 1: Simplified Block Diagram
During the conversion, the internal differential 14-bit
capacitive DAC output is sequenced by the SAR from the most
significant bit (MSB) to the least significant bit (LSB).
Referring to Figure 1, the +AIN and –AIN inputs are connected
to the sample-and-hold capacitors (CSAMPLE) during the
acquire phase and the comparator offset is nulled by the zero-
ing switches. In this acquire phase, a minimum delay of 200ns
will provide enough time for the sample-and-hold capacitors to
acquire the analog signal. During the convert phase, the
comparator zeroing switches open, putting the comparator into
compare mode. The input switches the CSAMPLE capacitors to
ground, transferring
the differential analog input charge onto the summing junction.
This input charge is successively compared with the binary
weighted charges supplied by the differential capacitive DAC.
Bit decisions are made by the high speed comparator. At the
end of a conversion, the differential DAC output balances the
+AIN and –AIN input charges. The SAR contents (a 14-bit data
word) which represents the difference of +AIN and –AIN are
loaded into the 14-bit output latches.
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
AS1419 & AS1419A
Rev. 0.1 1/04
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