FLASH
AS8F512K32
Austin Semiconductor, Inc.
ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS
(-55°C < TA < 125°C;VCC = 5V -5%/+10%)
Parameter
Speed Options
Symbol
JEDEC Std.
-70 -90 -120 -150
Parameter Description
Test Setup
CE\=VIL,
OE\=VIL
Units
tAVAV
tAVQV
tRC
Read Cycle Time (Note 3)
Min
70
90 120 150
ns
CE\=VIL,
OE\=VIL
tACC
Address to Output Delay
Max
Max
70
70
90 120 150
90 120 150
ns
ns
tELQV
tGLQV
tCE
tOE
Chip Enable Low to Output Valid
Output Enable to Output Delay
Max
Min
30
0
35
0
50
0
55
0
ns
ns
Read
Output Enable Hold Time
tOEH
Toggle and
(Note 3)
Data\Polling
Chip Enable High to Output High Z
(Note 2, 3)
Min
10
20
10
20
10
30
10
35
ns
ns
tEHQZ
tGHQZ
tAXQX
tHZ
tDF
tOH
Max
Output Enable to Output High Z
(Note 2,3)
Output Hold Time from Addresses, CE\
or OE\, Whichever Occurs First
20
0
20
0
30
0
35
0
ns
ns
Min
NOTES:
1. See Test Specification for test conditions.
2. Output driver disable time.
3. Guaranteed but not Tested.
Read OperationTimings
t
RC
Addresses
CE\
Addresses Stable
t
ACC
t
t
DF
CE
OE\
t
OEH
t
CE
t
WE\
OH
High-Z
High-Z
Outputs
Output Valid
OV
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
AS8F512K32
Rev. 4.0 6/01
11
MICROSS [ MICROSS COMPONENTS ]
