HAL 525, HAL 526
DATA SHEET
μA
dBμV
HAL 52x
HAL 52x
2
80
10
V
P
= 12 V
T
A
= 25 °C
Quasi-Peak-
Measurement
test circuit
70
1
10
V
DD
I
OH
60
50
40
30
20
10
0
0
10
max.spurious
signals
–1
10
V
= 24 V
OH
–2
10
V
OH
= 3.8 V
–3
10
10
10
–4
–5
–50
0
50
100
150
200
0.01
0.10
1.00 10.00 100.00 1000.00
10 100 1000
1
°C
MHz
T
A
f
Fig. 3–15: Typical output leakage current
Fig. 3–17: Typ. spectrum of supply voltage
versus ambient temperature
dBμA
HAL 52x
30
V
T
A
= 12 V
= 25 °C
DD
Quasi-Peak-
Measurement
20
10
I
DD
max.spurious
signals
0
–10
–20
–30
0.01
0.10
1.00 10.00 100.00 1000.00
10 100 1000
1
MHz
f
Fig. 3–16: Typ. spectrum of supply current
18
Nov. 30, 2009; DSH000144_003EN
Micronas