HAL300
Interferences conducted along supply lines in 12 V onboard systems
Product standard: DIN 40839 part 1
Pulse
Level
U in V
s
Test
circuit
Pulses/
Time
Function
Class
Remarks
1
IV
IV
IV
IV
IV
IV
–100
100
–150
100
–7
1
1
2
2
2
1
5000
5000
1 h
1h
C
C
A
A
A
C
5 s pulse interval
2
0.5 s pulse interval
3a
3b
4
5
5
86.5
10
10 s pulse interval
Electrical transient transmission by capacitive and inductive coupling via lines other than the supply lines
Product standard: DIN 40839 part 3
Pulse
Level
U in V
s
Test
circuit
Pulses/
Time
Function
Class
Remarks
1
IV
IV
IV
IV
–30
30
2
2
2
2
500
A
A
A
A
5 s pulse interval
2
500
0.5 s pulse interval
3a
3b
–60
40
10 min
10 min
Radiated Disturbances
Product standard: DIN 40839 part 4
Test Conditions
– Temperature: Room temperature (22...25 °C)
– Supply voltage: 13 V
– Lab equipment: TEM cell 220 MHz (VW standard)
with adaptor board 455 mm, device 80 mm over ground
– Frequency range: 5...220 MHz; 1 MHz steps
– Test circuit 2 with R = 1.2 kΩ
L
Tested Devices and Results
Type
Field
strength
Modulation
Result
1)
HAL300
> 200 V/m
1 kHz 80 %
output voltage stable on the level high or low
1)
low level t0.4 V, high level u90% of V
DD
12
Micronas
MICRONAS [ MICRONAS ]
