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MT250QL01GABA3EW70AITES 参数 Datasheet PDF下载

MT250QL01GABA3EW70AITES图片预览
型号: MT250QL01GABA3EW70AITES
PDF下载: 下载PDF文件 查看货源
内容描述: [3V, Multiple I/O, 4KB, 32KB, 64KB, Sector Erase]
分类和应用:
文件页数/大小: 97 页 / 1038 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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256Mb, 3V Multiple I/O Serial Flash Memory  
READ ID Operations  
READ ID Operations  
READ ID and MULTIPLE I/O READ ID Commands  
To initiate these commands, S# is driven LOW and the command code is input on DQn.  
When S# is driven HIGH, the device goes to standby. The operation is terminated by  
driving S# HIGH at any time during data output.  
Table 21: READ ID and MULTIPLE I/O READ ID Operations  
Operation Name  
Description/Conditions  
READ ID (9Eh/9Fh)  
Outputs information shown in the Device ID Data tables. If an ERASE or PROGRAM cycle is  
in progress when the command is initiated, the command is not decoded and the com-  
mand cycle in progress is not affected.  
MULTIPLE I/O READ ID (AFh)  
Figure 17: READ ID and MULTIPLE I/O READ ID Commands  
Extended (READ ID)  
0
7
8
15  
16  
31  
32  
C
LSB  
DQ0  
Command  
MSB  
LSB  
DOUT  
LSB  
DOUT  
LSB  
DOUT  
DOUT  
MSB  
DOUT  
MSB  
DOUT  
MSB  
DQ1  
High-Z  
Manufacturer  
identification  
Device  
identification  
UID  
Dual (MULTIPLE I/O READ ID )  
0
3
4
7
8
15  
C
LSB  
LSB  
DOUT  
LSB  
DOUT  
DOUT  
MSB  
DOUT  
MSB  
DQ[1:0]  
Command  
MSB  
Manufacturer  
identification  
Device  
identification  
Quad (MULTIPLE I/O READ ID )  
0
1
2
3
4
7
C
LSB  
LSB  
LSB  
DOUT  
MSB  
DOUT  
DOUT  
MSB  
DOUT  
DQ[3:0]  
Command  
MSB  
Manufacturer  
identification  
Device  
identification  
Don’t Care  
1. S# not shown.  
Note:  
CCMTD-1725822587-3368  
mt25q-qljs-L256-ABA-xxT.pdf - Rev. K 07/18 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
© 2014 Micron Technology, Inc. All rights reserved.  
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