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MT16VDDT3264AG-335 参数 Datasheet PDF下载

MT16VDDT3264AG-335图片预览
型号: MT16VDDT3264AG-335
PDF下载: 下载PDF文件 查看货源
内容描述: [DDR SDRAM UNBUFFERED DIMM]
分类和应用: 时钟动态存储器双倍数据速率光电二极管内存集成电路
文件页数/大小: 35 页 / 875 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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256MB, 512MB, 1GB, 2GB (x64, DR)  
184-PIN DDR SDRAM UDIMM  
Ta b le 5:  
Pin De scrip t io n s  
Pin numbers may not correlate with symbols; refer to Pin Assignment tables on page 3 for more information  
PIN NUMBERS  
SYMBOL  
TYPE  
DESCRIPTION  
63, 65, 154  
WE#, CAS#, RAS#  
Input  
Command Inputs: RAS#, CAS#, and WE# (along with S#) define  
the command being entered.  
16, 17, 75, 76, 137, 138  
CK0, CK0#, CK1,  
CK1#, CK2, CK2#  
Input Clock: CK, CK# are differential clock inputs. All address and  
control input signals are sampled on the crossing of the  
positive edge of CK,and negative edge of CK#. Output data  
(DQs and DQS) is referenced to the crossings of CK and CK#.  
21, 111  
CKE0, CKE1  
Input Clock Enable: CKE HIGH activates and CKE LOW deactivates  
the internal clock, input buffers and output drivers. Taking  
CKE LOW provides PRECHARGE POWER-DOWN and SELF  
REFRESH operations (all device banks idle), or ACTIVE POWER-  
DOWN (row ACTIVE in any device bank). CKE is synchronous  
for POWER-DOWN entry and exit, and for SELF REFRESH entry.  
CKE is asynchronous for SELF REFRESH exit and for disabling  
the outputs. CKE must be maintained HIGH throughout read  
and write accesses. Input buffers (excluding CK, CK# and CKE)  
are disabled during POWER-DOWN. Input buffers (excluding  
CKE) are disabled during SELF REFRESH. CKE is an SSTL_2 input  
but will detect an LVCMOS LOW level after VDD is applied and  
until CKE is first brought HIGH. After CKE is brought HIGH, it  
becomes an SSTL_2 input only.  
157, 158  
52, 59  
S0#, S1#  
Input  
Chip Selects: S# enables (registered LOW) and disables  
(registered HIGH) the command decoder. All commands are  
masked when S# is registered HIGH. S# is considered part of  
the command code.  
BA0, BA1  
Input  
Bank Address: BA0 and BA1 define to which device bank an  
ACTIVE, READ, WRITE, or PRECHARGE command is being  
applied.  
27, 29, 32, 37, 41, 43, 48,  
115 (512MB, 1GB, 2GB), 118,  
122, 125, 130, 141, 167 (2GB)  
A0–A11  
(256MB)  
A0–A12  
Input Address Inputs: Provide the row address for ACTIVE  
commands, and the column address and auto precharge bit  
(A10) for READ/WRITE commands, to select one location out of  
the memory array in the respective device bank. A10 sampled  
during a PRECHARGE command determines whether the  
PRECHARGE applies to one device bank (A10 LOW, device  
bank selected by BA0, BA1) or all device banks (A10 HIGH). The  
address inputs also provide the op-code during a MODE  
REGISTER SET command. BA0 and BA1 define which mode  
register (mode register or extended mode register) is loaded  
during the LOAD MODE REGISTER command.  
(512MB, 1GB)  
A0–A13  
(2GB)  
5, 14, 25, 36, 56, 67, 78, 86  
DQS0–DQS7  
DM0–DM7  
Input/  
Output  
Data Strobe: Output with READ data, input with WRITE data.  
DQS is edge-aligned with READ data, centered in WRITE data.  
Used to capture data.  
97, 107, 119, 129, 149, 159,  
169, 177  
Input Data Write Mask: DM LOW allows WRITE operation. DM HIGH  
blocks WRITE operation. DM lines do not affect READ  
operation.  
pdf: 09005aef80739fa5, source: 09005aef807397e5  
DD16C32_64_128_256x64AG.fm - Rev. C 9/04 EN  
Micron Technology, Inc., reserves the right to change products or specifications without notice.  
4
©2004 Micron Technology, Inc.  
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