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MT16VDDF6464HG-40B 参数 Datasheet PDF下载

MT16VDDF6464HG-40B图片预览
型号: MT16VDDF6464HG-40B
PDF下载: 下载PDF文件 查看货源
内容描述: [DDR SDRAM SODIMM]
分类和应用: 时钟动态存储器双倍数据速率光电二极管内存集成电路
文件页数/大小: 15 页 / 654 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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512MB, 1GB (x64, DR) 200-Pin DDR SODIMM  
Ele ct rica l Sp e cifica t io n s  
IDD Sp e cifica t io n s  
Ta b le 9:  
IDD Sp e cifica t io n s a n d Co n d it io n s – 512MB (Die Re viso n K)  
Values are shown for the MT46V32M8 DDR SDRAM only and are computed from values specified in the  
256Mb (32 Meg x 8) component data sheet  
Pa ra m e t e r/Co n d it io n  
Sym b o l  
-40B  
-335  
Un it s  
Op e ra t in g o n e b a n k a ct ive -p re ch a rg e cu rre n t : One device  
IDD01  
832  
752  
mA  
t
t
bank; Active-precharge; tRC = RC (MIN); tCK = CK (MIN); DQ, DM,  
and DQS inputs changing once per clock cycle; Address and control  
inputs changing once every two clock cycles  
Op e ra t in g o n e b a n k a ct ive -re a d -p re ch a rg e cu rre n t : One device  
IDD11  
992  
952  
mA  
t
bank; Active-read-precharge; BL = 4; tRC = RC (MIN);  
t
tCK = CK (MIN); IOUT = 0mA; Address and control inputs changing  
once per clock cycle  
Pre ch a rg e p o w e r-d o w n st a n d b y cu rre n t : All device banks idle;  
IDD2P2  
IDD2F2  
64  
64  
mA  
mA  
t
Power-down mode; tCK = CK (MIN); CKE = (LOW)  
Id le st a n d b y cu rre n t : CS# = HIGH; All device banks are idle;  
800  
800  
t
tCK = CK (MIN); CKE = HIGH; Address and other control inputs  
changing once per clock cycle. VIN = VREF for DQ, DQS, and DM  
Act ive p o w e r-d o w n st a n d b y cu rre n t : One device bank active;  
IDD3P2  
IDD3N2  
560  
960  
480  
880  
mA  
mA  
t
Power-down mode; tCK = CK (MIN); CKE = LOW  
Act ive st a n d b y cu rre n t : CS# = HIGH; CKE = HIGH; One device  
t
t
bank active; tRC = RAS (MAX); tCK = CK (MIN); DQ, DM, and DQS  
inputs changing twice per clock cycle; Address and other control  
inputs changing once per clock cycle  
Op e ra t in g b u rst re a d cu rre n t : BL = 2; Continuous burst reads;  
IDD4R1  
1,472  
1,472  
1,132  
1,312  
mA  
mA  
One device bank active; Address and control inputs changing once  
t
per clock cycle; tCK = CK (MIN); IOUT = 0mA  
Op e ra t in g b u rst w rit e cu rre n t : BL = 2; Continuous burst writes;  
IDD4W1  
One device bank active; Address and control inputs changing once  
t
per clock cycle; tCK = CK (MIN); DQ, DM, and DQS inputs changing  
twice per clock cycle  
t
Au t o re fre sh b u rst cu rre n t  
tREFC = RFC (MIN)  
tREFC = 7.8125µs  
Standard  
IDD52  
IDD5A2  
IDD62, 3  
IDD6A2, 3  
IDD71  
2,560  
96  
2,560  
96  
mA  
mA  
mA  
mA  
mA  
Se lf re fre sh cu rre n t : CKE 0.2V  
64  
64  
Low power  
32  
32  
Op e ra t in g b a n k in t e rle a ve re a d cu rre n t : Four device bank  
2,352  
2,192  
interleaving reads (BL = 4) with auto precharge;  
t
tRC = (MIN) tRC allowed; tCK = CK (MIN); Address and control  
inputs change only during active READ or WRITE commands  
Notes: 1. Value calculated as one module rank in this operating condition; all other module ranks are  
in IDD2P (CKE LOW) mode.  
2. Value calculated reflects all module ranks in this operating condition.  
3. The standard module guarantees IDD6 and the low-power module guarantees IDD6A.  
PDF: 09005aef80a77a90/Source: 09005aef80a646bc  
DDF16C64_128x64_L_H.fm - Rev. G 8/08 EN  
Micron Technology, Inc., reserves the right to change products or specifications without notice.  
©2003 Micron Technology, Inc. All rights reserved  
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