ML4961
ABSOLUTE MAXIMUM RATINGS
OPERATING CONDITIONS
Absolute maximum ratings are those values beyond which
the device could be permanently damaged. Absolute
maximum ratings are stress ratings only and functional
device operation is not implied.
Temperature Range
ML4961CS ................................................. 0°C to 70°C
ML4961ES .............................................. –20°C to 70°C
ML4961IS............................................... –40°C to 85°C
V
V
Operating Range
IN
Voltage on any pin ....................................................... 7V
ML4961CS .....................................1.0V to V
ML4961ES, ML4961IS ....................1.1V to V
–0.2V
–0.2V
OUT
OUT
Peak Switch Current, I
......................................... 2A
(AVG)
(PEAK)
Average Switch Current, I
.............................. 500mA
Operating Range ................................. 2.5V to 6.0V
OUT
Junction Temperature .............................................. 150°C
Storage Temperature Range ...................... –65°C to 150°C
Lead Temperature (Soldering 10 sec.) ...................... 260°C
Thermal Resistance (θ )..................................... 160°C/W
JA
ELECTRICAL CHARACTERISTICS
Unless otherwise specified, VIN = Operating Voltage Range, T = Operating Temperature Range (Note 1)
A
PARAMETER
CONDITIONS
MIN
TYP.
MAX
UNITS
Supply
VIN Current
VIN = VOUT – 0.2V
45
3
55
5
µA
µA
µA
VOUT Quiescent Current
VL Quiescent Current
PFM Regulator
1
Pulse Width (TON
)
VIN = 2.4V
C/E Suffix
I Suffix
9
10
10
11
µs
µs
8.5
194
11.5
206
SENSE Comparator
200
mV
Threshold Voltage (VSENSE
)
Load Regulation
See Figure 1
V
IN = 1.2V, IOUT ≤ 25mA
4.85
4.85
5.0
5.0
5.15
5.15
V
V
VIN = 2.4V, IOUT ≤ 135mA
Undervoltage Lockout Threshold
C/E Suffix
I Suffix
0.85
0.95
0.95
1.05
V
V
RESET Comparator
DETECT Threshold
190
–100
200
210
100
mV
nA
V
DETECT Bias Current
RESET Output High Voltage (VOH
)
IOH = –100µA
IOL = 100µA
VOUT – 0.2
RESET Output Low Voltage (VOL
)
0.2
V
Note 1: Limits are guaranteed by 100% testing, sampling, or correlation with worst case test conditions.
3