ML4790
Storage Temperature Range .................... –65°C to +150°C
Lead Temperature (Soldering 10s).......................... +260°C
ABSOLUTE MAXIMUM RATINGS
Thermal Resistance (θ )
Absolute maximum ratings are those values beyond which
the device could be permanently damaged. Absolute
maximum ratings are stress ratings only and functional
device operation is not implied.
JA
Plastic SOIC ....................................................110°C/W
OPERATING CONDITIONS
Temperature Range
V
........................................................................ 7V
BOOST
ML4790CS-X ............................................ 0°C to +70°C
ML4790ES-X......................................... –20°C to +70°C
IN
Voltage on Any Other Pin ...GND –0.3V to V
+0.3V
BOOST
Peak Switch Current (I
Average Switch Current (I
LDO Output Current ............................................. 250mA
Junction Temperature .............................................. 150°C
) .......................................... 1A
AVG
PEAK
V
Range
) ............................... 500mA
ML4790CS-X ................................................ 1.0V to 6V
ML4790ES-X................................................. 1.1V to 6V
OUT
V
Range .................................................. 2.5V to 5.5V
ELECTRICAL CHARACTERISTICS
Unless otherwise specified, V = Operating Voltage Range, T = Operating Temperature Range. (Note 1)
IN
A
PARAMETER
CONDITIONS
MIN
TYP.
MAX
UNITS
Supply
VIN Current
VIN = 6V
60
15
8
75
25
10
1
µA
µA
µA
µA
SHDN = high
VOUT Quiescent Current
VL Quiescent Current
PFM Regulator
VBOOST = VOUT + 0.5V
Pulse Width (TON
)
4.5
5
5.5
µs
LDO
SENSE Comparator Threshold Voltage
Load Regulation
194
200
206
mV
See Figure 1
VIN = 1.2V, IOUT < 10mA
VIN = 2.4V, IOUT < 75mA
4.85
4.85
5.0
5.0
5.15
5.15
V
V
Dropout Voltage
See Figure 1
VIN = 1.2V, IOUT < 10mA
VIN = 2.4V, IOUT < 75mA
300
500
mV
mV
Output Ripple
Shutdown
5
mVP-P
SHDN Threshold
SHDN Bias Current
0.5
0.8
1.0
V
–100
100
nA
Note 1: Limits are guaranteed by 100% testing, sampling, or correlation with worst case test conditions.
22µH
(Sumida CD54)
ML4790
V
V
IN
PWR GND
SHDN
IN
GND
100µF
SENSE
V
L
1nF
V
OUT
V
BOOST
33µF
I
OUT
931kΩ
V
OUT
39.2kΩ
100µF
Figure 1. Application Test Circuit
3