ML4423
ABSOLUTE MAXIMUM RATINGS
Absolute maximum ratings are those values beyond which
the device could be permanently damaged. Absolute
maximum ratings are stress ratings only and functional
device operation is not implied.
Thermal Resistance (q )
Plastic DIP ....................................................... 52ºC/W
Plastic SOIC .................................................... 75ºC/W
JA
OPERATING CONDITIONS
V
.............................................................................................. 15V
DD
Output Drive Current ........................................... ±50mA
Logic Inputs (F/R, COAST) .............................. –0.3 to 7V
Junction Temperature.............................................. 150ºC
Storage Temperature Range ...................... –65ºC to 150ºC
Lead Temperature (Soldering 10 sec) ...................... 260ºC
Temperature Range
C Suffix...................................................... 0ºC to 70ºC
I Suffix ....................................................–40ºC to 85ºC
DD
V
...........................................................9.6V to 14.4V
ELECTRICAL CHARACTERISTICS
Unless otherwise specified, V
= 12V ± 20%, R
DT A
= 160kW, R
= 250mW, R
= 200kW,
REF
DD
SPEED
SENSE
C = 0.47mF, C
= 220pF, R = 166kW, T = Operating Temperature Range (Note 1).
0
PWM
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
REFERENCE
VREF
Output Voltage
Line Regulation
Total Variation
7.6
7.8
8.2
V
Line, Temperature
DIGITAL INPUTS
VIL
Input Low Voltage
Input High Voltage
0.8
V
V
VIH
2
OUTPUT DRIVERS
VOL
Output Low Voltage
IOL = 20mA, 5V/12V SELECT = VDD
IOL = 2mA, 5V/12V SELECT = open
IOL = –20mA, 5V/12V SELECT = VDD
IOL = –2mA, 5V/12V SELECT = open
1
0.1
V
V
V
V
VOH
Output High Voltage
VDD – 1
5
SINE WAVE GENERATOR
VPP
Peak Voltage
Frequency
Distortion
VSPEED = 4.4V
VSPEED = 4.4V
3.4
60
5
V
Hz
%
PWM GENERATOR
Ramp Frequency
CURRENT LIMIT
Threshold Voltage
25
kHz
V
0.4
7.8
0.5
0.6
9.2
UNDERVOLTAGELOCKOUT
Threshold Voltage
Hysteresis
8.4
0.5
V
V
SUPPLY
ICC
VCC Operating Current
10
14
20
mA
Note 1: Limits are guaranteed by 100% testing, sampling, or correlation with worst-case test conditions.
4