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MIC384-0BMM 参数 Datasheet PDF下载

MIC384-0BMM图片预览
型号: MIC384-0BMM
PDF下载: 下载PDF文件 查看货源
内容描述: 三区热监事高级信息 [Three-Zone Thermal Supervisor Advance Information]
分类和应用:
文件页数/大小: 21 页 / 122 K
品牌: MICREL [ MICREL SEMICONDUCTOR ]
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MIC384
Symbol
Parameter
Condition
Min
Typ
Max
Micrel
Units
Serial Data I/O Pin (DATA)
V
OL
V
IL
V
IH
C
IN
I
LEAK
V
IL
V
IH
C
IN
I
LEAK
V
OL
t
INT
t
nINT
T_SET0
T_HYST0
T_SET1
T_HYST1
T_SET2
T_HYST2
Low Output Voltage
Note 6
Low Input Voltage
High Input Voltage
Input Capacitance
Input current
2.7V
V
DD
5.5V
2.7V
V
DD
5.5V
0.7V
DD
10
±0.01
I
OL
= 3mA
I
OL
= 6mA
2.7V
V
DD
5.5V
2.7V
V
DD
5.5V
0.7V
DD
10
±0.01
0.4
0.8
0.3V
DD
V
V
V
V
pF
±
1
0.3V
DD
µA
Serial Clock Input (CLK)
Low Input Voltage
High Input Voltage
Input Capacitance
Input current
V
V
pF
±
1
0.4
0.8
t
CONV
+1
1
µA
Status Output (/INT)
Low Output Voltage,
Note 6
Interrupt Propagation Delay,
Note 7, 8
Interrupt Reset Propagation Delay,
Note 7
Default T_SET0 Value
Default T_HYST0 Value
Default T_SET1 Value
Default T_HYST1 Value
Default T_SET2 Value
Default T_HYST2 Value
I
OL
= 3mA
I
OL
= 6mA
from TEMPx > T_SETx or TEMPx < T_HYSTx
to /INT < V
OL
, FQ = 00, R
PULLUP
= 10kΩ
from any register read to /INT > V
OH
,
R
PULLUP
= 10kΩ
t
POR
after V
DD
> V
POR
t
POR
after V
DD
> V
POR
t
POR
after V
DD
> V
POR
t
POR
after V
DD
> V
POR
t
POR
after V
DD
> V
POR
t
POR
after V
DD
> V
POR
81
76
97
92
97
92
81
76
97
92
97
92
V
V
µs
µs
°C
°C
°C
°C
°C
°C
µs
ns
ns
ns
ns
81
76
97
92
97
92
Serial Interface Timing (Note 7)
t
1
t
2
t
3
t
4
t
5
Note 1.
Note 2.
Note 3.
Note 4.
Note 5.
Note 6.
Note 7.
Note 8.
CLK (Clock) Period
Data In Setup Time to CLK High
Data Out Stable After CLK Low
DATA Low Setup Time to CLK Low
DATA High Hold Time
After CLK High
start condition
stop condition
2.5
100
0
100
100
Exceeding the absolute maximum rating may damage the device.
The device is not guaranteed to function outside its operating rating.
Devices are ESD sensitive. Handling precautions recommended.
Human body model: 1.5k in series with 100pF. Machine model: 200pF, no series resistance.
Final test on outgoing product is performed at T
A
= TBD°C.
T
D
is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 6.
Current into this pin will result in self-heating of the MIC384. Sink current should be minimized for best accuracy.
Guaranteed by design over the operating temperature range. Not 100% production tested.
t
CONV
= t
CONV0
+(2 X t
CONV1
). t
CONV0
is the conversion time for the local zone; t
CONV1
is the conversion time for the remote zones.`
MIC384
4
September 2000