MIC284
Symbol
V
OL
V
IL
Parameter
Low Output Voltage
Note 6
Low Input Voltage
High Input Voltage
Input Capacitance
Input current
Low Input Voltage
High Input Voltage
Input Capacitance
Input current
Low Output Voltage,
Note 6
Interrupt Propagation Delay,
Note 7, 8
Interrupt Reset Propagation Delay,
Note 7
Default T_SET0 Value
Default T_HYST0 Value
Default T_SET1 Value
Default T_HYST1 Value
Low Output Voltage,
Note 6
/CRIT Propagation Delay,
Note 7, 8
/CRIT Reset Propagation Delay,
Note 7
Default CRIT1 Value
Default nCRIT1 Value
CLK (Clock) Period
Data In Setup Time to CLK High
Data Out Stable After CLK Low
DATA Low Setup Time to CLK Low
DATA High Hold Time
After CLK High
start condition
stop condition
I
OL
= 3mA
2.7V ≤ V
DD
≤ 5.5V
2.7V ≤ V
DD
≤ 5.5V
Condition
I
OL
= 3mA
Min
Typ
Serial Data I/O Pin (DATA)
Micrel, Inc
Max
0.4
0.8
0.7V
DD
0.3V
DD
10
±0.01
±1
0.3V
DD
10
±0.01
±1
0.4
0.8
t
CONV
+1
1
81
76
97
92
81
76
97
92
81
76
97
92
0.4
0.8
t
CONV
+1
1
97
92
2.5
100
0
100
100
97
92
97
92
Units
V
V
V
V
pF
µA
V
V
pF
µA
V
V
µs
µs
°C
°C
°C
°C
V
V
µs
µs
°C
°C
µs
ns
ns
ns
ns
I
OL
= 6mA
V
IH
2.7V ≤ V
DD
≤ 5.5V
2.7V ≤ V
DD
≤ 5.5V
C
IN
I
LEAK
V
IL
Serial Clock Input (CLK)
V
IH
0.7V
DD
C
IN
I
LEAK
V
OL
t
INT
t
nINT
Status Output (/INT)
I
OL
= 6mA
T_SET0
T_HYST0
T_SET1
T_HYST1
V
OL
t
CRIT
t
nCRIT
CRIT1
nCRIT1
t
1
t
2
t
3
t
4
t
5
Note 1.
Note 2.
Note 3.
Note 4.
Note 5.
Note 6.
Note 7.
Note 8.
Note 9.
from any register read to /INT > V
OH
FQ = 00, R
PULLUP
= 10kΩ
t
POR
after V
DD
> V
POR
t
POR
after V
DD
> V
POR
t
POR
after V
DD
> V
POR
t
POR
after V
DD
> V
POR
I
OL
= 3mA
from TEMP > T_SET or TEMPx < T_HYSTx
to INT < V
OL
, FQ = 00, R
PULLUP
= 10kΩ
Over-Temperature Output (/CRIT)
I
OL
= 6mA
from TEMPx < nCRITx to /CRIT > V
OH
FQ = 00, R
PULLUP
= 10kΩ
t
POR
after V
DD
> V
POR
t
POR
after V
DD
> V
POR
from TEMPx > T_SETx or TEMPx < T_HYSTx
to INT < V
OL
, FQ = 00, R
PULLUP
= 10kΩ
Serial Interface Timing (Note 7)
Exceeding the absolute maximum rating may damage the device.
The device is not guaranteed to function outside its operating rating.
Devices are ESD sensitive. Handling precautions recommended.
Human body model: 1.5k in series with 100pF. Machine model: 200pF, no series resistance.
Final test on outgoing product is performed at T
A
= TBD°C.
T
D
is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 6.
Current into this pin will result in self-heating of the MIC284. Sink current should be minimized for best accuracy.
Guaranteed by design over the operating temperature range. Not 100% production tested.
Accuracy specification does not include quantization noise, which may be as great as ±
1
⁄
2
LSB (±0.5°C).
t
CONV
= t
CONV0
+ t
CONV1
. t
CONV0
is the conversion time for the local zone; t
CONV1
is the conversion time for the remote zone.`
MIC284
4
September 2005
MICREL [ MICREL SEMICONDUCTOR ]
