MIC284
Micrel, Inc.
Event
high temperature, remote
high temperature, local
low temperature, remote
low temperature, local
over-temperatue, remote
NOT over-temperature,
remote
diode fault
Condition* *
TEMP1 > T_SET1
TEMP0 > T_SET0
TEMP1 > T_HYST1
TEMP0 > T_HYST0
TEMP1 > CRIT1
TEMP1 > nCRIT1
T1 open or T1 shorted to VDD or GND
MIC284 response *
set S1 in CONFIG, assert /IN T
set S0 in CONFIG, assert /IN T
set S1 in CONFIG, assert /IN T
set S0 in CONFIG, assert /IN T
set CRIT in CONFIG, assert /CRIT
clear CRIT in CONFIG, de-assert /CRIT
set CRIT and S1 in CONFIG, assert /INT
and /CRIT***
*
Assumes interrupts enabled
** Condition must be true for FAULT_QUEUE conversion to be recognized
*** Assumes the T_SET1 and CRIT1 are set yo any value less then +127° C = 7f
h
= 0111 1111
b
Table 5. MIC284 Temperature Events
September 2005
13
MIC284
MICREL [ MICREL SEMICONDUCTOR ]
