MIC280-0BM6 参数 Datasheet PDF下载

MIC280

Symbol

V

OL

V

IL

Parameter

Low Output Voltage, Note 4

Low Input Voltage

High Input Voltage

Input Capacitance

Input Current

Low Input Voltage

High Input Voltage

Input Capacitance

Input Current

Low Output Voltage, Note 4

Interrupt Propagation Delay

Notes 5, 6

Interrupt Reset Propagation Delay

Note 5, 9

I

OL

= 3mA

3V ≤ V

DD

≤ 3.6V

3V ≤ V

DD

≤ 3.6V

Note 5

Condition

I

OL

= 3mA

3V ≤ V

DD

≤ 3.6V

3V ≤ V

DD

≤ 3.6V

Note 5

I

OL

= 6mA

Min

Typ

Max

0.3

0.5

0.8

2.1

10

±1

0.8

2.1

10

±1

0.3

0.5

[t

CONV

]

1

±1

2.5

100

300

Start Condition

Stop Condition

100

100

25

30

35

5.5

5.5

Serial Data I/O Pin, DATA

Micrel

Units

V

V

V

V

pF

µA

V

V

pF

µA

V

V

ms

V

IH

C

IN

I

LEAK

V

IL

Serial Clock Input, CLK

V

IH

C

IN

I

LEAK

V

OL

t

INT

t

nINT

I

LEAK

t

1

t

2

t

3

t

4

t

5

t

TO

Interrupt Output, /INT

I

OL

= 6mA

from read of STATUS or A.R.A. to

/INT > V

OH

; R

PULLUP

= 10kΩ

from TEMPx < TLOWx or

TEMPx > THIGHx or TEMPx >

CRITx to /INT < V

OL

; R

PULLUP

= 10kΩ

µs

µA

µs

ns

ns

ns

ns

ms

Serial Interface Timing

CLK (Clock) Period

Data In Setup Time to CLK High

Data Out Stable after CLK Low

Data Low Setup Time to CLK Low

Data High Hold Time after CLK

High

Bus Timeout

Exceeding the absolute maximum rating may damage the device.

The device is not guaranteed to function outside its operating range. Final test on outgoing product is performed at T

A

= 25°C.

Devices are ESD sensitive. Handling precautions recommended.

Current into the /INT or DATA pins will result in self heating of the device. Sink current should be minimized for best accuracy.

Guaranteed by design over the operating temperature range. Not 100% production tested.

t

INT

and t

CRIT

are equal to t

CONV

.

T

D

is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 8.

Note 1.

Note 2.

Note 3.

Note 4.

Note 5.

Note 6.

Note 7.

Note 8.

Note 9.

t

CONV

= t

CONV

(local) + t

CONV

(remote). Following the acquisition of either remote or local temperature data, the limit comparisons for that zone

are performed and the device status updated; Status bits will be set and /INT driven active, if applicable.

The interrupt reset propogation delay is dominated by the capacitance on the bus.

Note 11.

Tested at 10-bit resolution.

Note 10.

Accuracy specification does not include quantization noise, which may be up to ±

1

/

2

LSB.

MIC280

4

November 2004