WF128K32-XXX5
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS, CS CONTROLLED
(VCC = 5.0V, VSS = 0V, TA = -55°C to +125°C)
Parameter
Symbol
-50
-60
-70
Max Min Max
70
-90
Min Max
90
-120
-150
Unit
Min Max Min
Min Max Min Max
Write Cycle Time
tAVAV
tWC
tWS
tCP
50
0
60
0
120
0
150
0
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
sec
ns
WE Setup Time
tWLEL
tELEH
0
35
0
0
45
0
CS Pulse Width
25
0
30
0
50
0
50
0
Address Setup Time
Data Setup Time
tAVEL
tAS
tDVEH
tEHDX
tELAX
tDS
tDH
tAH
tWH
tCPH
25
0
30
0
30
0
45
0
50
0
50
0
Data Hold Time
Address Hold Time
40
0
45
0
45
0
45
0
50
0
50
0
WE Hold from WE High
CS Pulse Width High
Duration of Programming Operation
Duration of Erase Operation
Read Recovery before Write
Chip Programming Time
tEHWH
tEHEL
20
14
2.2
0
20
14
2.2
0
20
14
20
14
20
14
2.2
0
20
14
2.2
0
tWHWH1
tWHWH2
tGHEL
60
60
2.2 60
2.2
0
60
60
60
0
12.5
12.5
12.5
12.5
12.5
12.5 sec
7
AC TEST CONDITIONS
FIG. 4
AC TEST CIRCUIT
Parameter
Typ
Unit
V
IOL
Current Source
Input Pulse Levels
VIL = 0, VIH = 3.0
Input Rise and Fall
5
ns
V
Input and Output Reference Level
Output Timing Reference Level
1.5
1.5
V
D.U.T.
VZ
≈
1.5V
(Bipolar Supply)
Ceff = 50 pf
NOTES:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
IOH
Current Source
White Microelectronics • Phoenix, AZ • (602) 437-1520
4
MERCURY [ MERCURY UNITED ELECTRONICS INC ]
