WEDPS512K32V-XBX
AC CHARACTERISTICS
VCC = 3.3V, -55°C ≤ TA ≤ +125°C
-12
-15
-17
-20
Parameter
Read Cycle
Symbol
Units
Min
Max
Min
Max
Min
Max
Min
Max
Read Cycle Time
Address Access Time
Output Hold from Address Change
Chip Select Access Time
Output Enable to Output Valid
Chip Select to Output in Low Z
Output Enable to Output in Low Z
Chip Disable to Output in High Z
Output Disable to Output in High Z
1. This parameter is guaranteed by design but not tested.
tRC
tAA
12
15
17
20
ns
ns
ns
ns
ns
ns
ns
ns
ns
12
15
17
20
tOH
tACS
tOE
0
0
0
0
12
7
15
8
17
8
20
10
1
tCLZ
1
0
1
0
1
0
1
0
1
tOLZ
tCHZ
tOHZ
1
7
7
8
8
8
8
10
10
1
AC CHARACTERISTICS
VCC = 3.3V, -55°C ≤ TA ≤ +125°C
-12
-15
-17
-20
Parameter
Symbol
Units
Min
Max
Min
Max
Min
Max
Min
Max
Write Cycle
Write Cycle Time
tWC
tCW
tAW
tDW
tWP
tAS
12
10
10
8
10
0
15
12
12
9
12
0
17
12
12
9
14
0
20
14
14
10
14
0
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Chip Select to End of Write
Address Valid to End of Write
Data Valid to End of Write
Write Pulse Width
Address Setup Time
Address Hold Time
Output Active from End of Write
Write Enable to Output in High Z
Data Hold Time
tAH
0
2
0
2
0
3
0
3
1
tOW
1
tWHZ
tDH
7
8
8
9
0
0
0
0
1. This parameter is guaranteed by design but not tested.
FIGURE 4 – AC TEST CIRCUIT
AC Test Conditions
Parameter
Typ
Unit
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
NOTES:
VIL = 0, VIH = 3.0
V
ns
V
5
1.5
1.5
IOL
Current Source
V
V
I
Z is programmable from -2V to +7V.
OL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 Ω.
Z is typically the midpoint of VOH and VOL
OL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
VZ » 1.5V
(Bipolar Supply)
D.U.T.
V
I
.
Ceff = 50 pf
IOH
Current Source
Microsemi Corporation reserves the right to change products or specifications without notice.
May 2011 © 2011 Microsemi Corporation. All rights reserved.
Rev. 6
3
Microsemi Corporation • (602) 437-1520 • www.microsemi.com
MERCURY [ MERCURY UNITED ELECTRONICS INC ]
