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MLX90314LDF 参数 Datasheet PDF下载

MLX90314LDF图片预览
型号: MLX90314LDF
PDF下载: 下载PDF文件 查看货源
内容描述: 可编程传感器接口 [Programmable Sensor Interface]
分类和应用: 传感器
文件页数/大小: 28 页 / 798 K
品牌: MELEXIS [ Melexis Microelectronic Systems ]
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MLX90314  
Programmable Sensor Interface  
Analog Features  
Supply Regulator  
A bandgap-stabilized supply-regulator is on-chip while  
the pass-transistor is external. The bridge-type sensor  
is typically powered by the regulated supply (typically  
4.75V). For ratiometric operation, the supply-regulator  
can be disabled by connecting together the  
unregulated and regulated supply pins.  
Power-On Reset  
The Power-On Reset (POR) initializes the state of the  
digital part after power up. The reset circuitry is  
completely internal. The chip is completely reset and  
fully operational 3.5 ms from the time the supply crosses  
3.5 volts. The POR circuitry will issue another POR if  
the supply voltage goes below this threshold for 1.0 us.  
Test Mode  
For 100% testability, a "TEST" pin is provided. If the pin  
is pulled low, then the monitor program is entered and  
the chip changes its functionality. In all other  
applications, this pin should be pulled high or left  
floating (internal pull-up).  
Oscillator  
The MLX90314 contains a programmable on-chip RC  
oscillator. No external components are needed to set  
the frequency (87.8 kHz +/-1%). The MCU-clock is  
generated by a PLL (phase locked loop tuned for 614  
kHz or 2.46 Mhz) which locks on the basic oscillator.  
Temperature Sense  
The temperature measurement, TPO, is generated from  
the external or internal temperature sensor. This is  
converted to a 10-bit number for use in calculating the  
signal compensation factors. A 2-bit coarse adjustment  
GNTP[1:0] is used for the temperature signal gain &  
offset adjustment.  
The frequency of the internal clock is stabilized over  
the full temperature range, which is divided into three  
regions, each region having a separate digital clock  
setting. All of the clock frequency programming is  
done by Melexis during final test of the component.  
The device uses the internal temperature sensor to  
determine which temperature range setting to use.  
A/D and D/A  
Conversions using only one DAC  
For saving chip area, the "Offset DAC" is multiplexed  
in various ways. Both "fine offset" and "digital mode"  
signals are stored on a capacitor. An ADC-loop is  
available by using a comparator and SAR.  
D/A  
Before changing to another capacitor, the DAC output  
should be settled to the new value. For example,  
MODSEL moves the analog multiplexer to the so-  
called "open state 0." At the same time, the 10 bit mux  
selects OF[9:0] for the offset-DAC. After the DAC  
settling time, the analog multiplexer is moved to its  
final state and the DAC-output is stored on  
capacitor.  
a
A/D  
The S/W-Signal MODSEL connects the SAR-output to  
the DAC and the DAC-output to the comparator. The  
SARegister is initialized by a rising edge of STC (S/W  
signal). At the end of the A/D conversion, the  
EOC flag is set to 1 and the controller can read the  
ADC values.  
3901090314  
Page 9  
Nov/04  
Rev 007