欢迎访问ic37.com |
会员登录 免费注册
发布采购

MG87FL52GF 参数 Datasheet PDF下载

MG87FL52GF图片预览
型号: MG87FL52GF
PDF下载: 下载PDF文件 查看货源
内容描述: 8位微控制器 [8 bits microcontroller]
分类和应用: 微控制器
文件页数/大小: 44 页 / 857 K
品牌: MEGAWIN [ MEGAWIN TECHNOLOGY CO., LTD ]
 浏览型号MG87FL52GF的Datasheet PDF文件第33页浏览型号MG87FL52GF的Datasheet PDF文件第34页浏览型号MG87FL52GF的Datasheet PDF文件第35页浏览型号MG87FL52GF的Datasheet PDF文件第36页浏览型号MG87FL52GF的Datasheet PDF文件第38页浏览型号MG87FL52GF的Datasheet PDF文件第39页浏览型号MG87FL52GF的Datasheet PDF文件第40页浏览型号MG87FL52GF的Datasheet PDF文件第41页  
Megawin Technology Co., Ltd.  
MG87FE/L52  
14.0 Absolute Maximum Rating  
MG87FE52: (5.0V application)  
Parameter  
Rating  
-55 ~ +125  
Unit  
°C  
°C  
V
Ambient temperature under bias  
Storage temperature  
-65 ~ + 150  
Voltage on any Port I/O Pin or RST with respect to  
Ground  
-0.5 ~ VDD + 0.5  
Voltage on VDD with respect to Ground  
Maximum total current through VDD and Ground  
Maximum output current sunk by any Port pin  
-0.5 ~ +6.0  
400  
V
mA  
mA  
40  
*Note: stresses above those listed under “Absolute Maximum Ratings” may cause permanent  
damage to the device. This is a stress rating only and functional operation of the devices at  
those or any other conditions above those indicated in the operation listings of this specification  
is not implied. Exposure to maximum rating conditions for extended periods may affect device  
reliability.  
MG87FL52: (3.3V application)  
Parameter  
Rating  
-55 ~ +125  
Unit  
°C  
°C  
V
Ambient temperature under bias  
Storage temperature  
-65 ~ + 150  
Voltage on any Port I/O Pin or RST with respect to  
Ground  
-0.3 ~ VDD + 0.3  
Voltage on VDD with respect to Ground  
Maximum total current through VDD and Ground  
Maximum output current sunk by any Port pin  
-0.3 ~ +4.2  
400  
V
mA  
mA  
40  
*Note: stresses above those listed under “Absolute Maximum Ratings” may cause permanent  
damage to the device. This is a stress rating only and functional operation of the devices at  
those or any other conditions above those indicated in the operation listings of this specification  
is not implied. Exposure to maximum rating conditions for extended periods may affect device  
reliability.  
37  
Preliminary ver 1.3  
Date: 2009-JAN-20  
 复制成功!