MX29LV320AT/B
ERASE AND PROGRAMMING PERFORMANCE(1)
LIMITS
PARAMETER
MIN.
TYP.(2)
MAX.
15
UNITS
sec
sec
us
Sector Erase Time
Chip Erase Time
0.9
35
9
50
Byte Programming Time
Word Program Time
Chip Programming Time
300
360
108
72
11
36
24
7
us
Byte Mode
Word Mode
sec
sec
us
Accelerated Byte/Word Program Time
Erase/Program Cycles
210
100,000
Cycles
Note: 1.Not 100% Tested, Excludes external system level over head.
2.Typical values measured at 25°C,3.3V.
LATCH-UP CHARACTERISTICS
MIN.
-1.0V
MAX.
Input Voltage with respect to GND on all pins except I/O pins
Input Voltage with respect to GND on all I/O pins
VCC Current
12.5V
Vcc + 1.0V
+100mA
-1.0V
-100mA
Includes all pins except Vcc. Test conditions: Vcc = 3.0V, one pin at a time.
TSOP PIN CAPACITANCE
Parameter Symbol
Parameter Description
Input Capacitance
Test Set
VIN=0
TYP
MAX
7.5
12
UNIT
pF
CIN
6
COUT
CIN2
Output Capacitance
Control Pin Capacitance
VOUT=0
VIN=0
8.5
7.5
pF
9
pF
Notes:
1. Sampled, not 100% tested.
2.Test conditions TA=25°C, f=1.0MHz
P/N:PM1008
REV. 1.1, MAY 28, 2004
53
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