MX29F200T/B
SWITCHING TEST CIRCUITS
DEVICE UNDER
TEST
1.6K ohm
+5V
CL
1.2K ohm
DIODES=IN3064
OR EQUIVALENT
CL=100pF Including jig capacitance for 70ns max.
CL= 30pF Including jig capacitance for 55ns max.
SWITCHING TEST WAVEFORMS(I) for 29F200T/B-70, 29F200T/B-90, 29F200T/B-12
2.4V
2.0V
0.8V
2.0V
0.8V
TEST POINTS
0.45V
INPUT
OUTPUT
AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".
Input pulse rise and fall times are < 10ns.
SWITCHING TEST WAVEFORMS(II) for 29F200T/B-55
3.0V
TEST POINTS
1.5V
1.5V
0V
INPUT
OUTPUT
AC TESTING: Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0".
Input pulse rise and fall times are < 5ns.
P/N:PM0549
REV. 1.3 , DEC. 24, 2001
24
Macronix [ MACRONIX INTERNATIONAL ]
