DA6505.005
11 June 2018
ELECTRICAL CHARACTERISTICS
TA = -40oC to +90oC, VDD = 1.71V to 5.5V, Typ TA = 25°C, Typ VDD = VDDIO = 1.8 V, Typ VDDS = 1.68 V, RSENSOR = 6k
unless otherwise noted
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
ADC Linearity
INLADC
GAINx=1
OSRx = ¼
3700 (11.2)
760 (13.5)
260 (15.1)
310 (14.8)
360 (14.6)
330 (14.7)
260 (15.1)
OSRx = ½
OSRx = 1
OSRx = 2
OSRx = 4
OSRx = 8
OSRx = 16
LSB (bit)
x = P or T, note 1
Sensor Input
Linearity
INLAFE
GAINx=4.7
VIN=VIN_LIN_MIN...VIN_LIN_MAX
OSRx = ¼
3800 (11.2)
610 (13.8)
340 (14.7)
470 (14.2)
510 (14.1)
460 (14.3)
430 (14.4)
LSB (bit)
OSRx = ½
OSRx = 1
OSRx = 2
OSRx = 4
OSRx = 8
OSRx = 16
x = P or T, note 1
GAINx=1, OSRx = 16,
VIN=VIN_LIN_MIN...VIN_LIN_MAX
Note 2
ADC VDD
Sensitivity
VDDSENSADC
±0.0008
1400
%FS/V
mVpp
mVpp
ADC Input Signal
Range
ADC Linear Input
Signal Range
ISRADC
VDDS=1.68V
ISRLINADC
VDDS=1.68V
10%...90% (80%) of
ISRADC
1120
0
11184810
10066329
Full Scale Output
Code Range
Values
Linear Range
Output Code
Values (10%...90%
of Full Scale Code
Range)
CODEFS
CODELIN
-
-
1118481
EEPROM size
Note 3
Note 4
512
bit
ms
EEPROM data
write time
13
EEPROM data
retention
TA = +125 °C, AEC-Q100-
005, Note 5
20
years
Note 1. Linearity in bits is calculated from output code as follows: INL [bit] = log(80%*CODEFSMAX / INL)/log(2) when integral nonlinearity (INL)
is calculated from best fit line to linear input signal range containing 21 pcs analysis points.
Note 2. VDD is stepped from 1.8V to 3.6V and VDD sensitivity in %FS/V calculated as
VDDSENS =100%*(CODE(VDD=3.6V) –CODE(VDD=1.8V))/CODEFS/(3.6V-1.8V)
Note 3. 48 bits out of 512 bits are reserved for internal EEPROM oscillator and clock oscillator trimming, temperature and pressure
measurement gain and offset configurations and sensor resistance trimming. The remaining 464 bits can be freely used for storing calibration
coefficients and other data.
Note 4. There should be at least a 13ms delay after each EEPROM write since EEPROM programming can take up to 13ms.
Note 5. Data retention values apply when extended EEPROM tests are done. Please contact Micro Analog Systems Oy if the data retention
values here need to be guaranteed by comprehensive EEPROM testing.
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MAS [ MICRO ANALOG SYSTEMS ]
