TABLE 2: ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group B and D for Class S
End Point Electrical Parameters (Method 5005)
* PDA applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*,2,3,4,5,6
1,2,3,4,5,6
1,2,3
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after
burn-in divided by the total number of devices submitted for burn-in in
that lot shall be used to determine the percent for the lot.
Analog Devices, Inc. reserves the right to test to tighter limits than those
given.
TOTAL DOSE BIAS CIRCUIT
10k
15V
–
8V
10k
+
–15V
RH1014M TDBC
TYPICAL PERFORMANCE CHARACTERISTICS
Supply Current (Per Amplifier)
0.8
V
S
= ±15V
R
L
= 10k
SUPPLY CURRENT (mA)
0.6
POSITIVE SLEW RATE (V/µs)
0.8
V
S
= ±15V
R
L
= 10k
0.6
NEGATIVE SLEW RATE (V/µs)
0.6
Positive Slew Rate
0.8
Negative Slew Rate
V
S
= ±15V
R
L
= 10k
0.4
0.4
0.4
0.2
0.2
0.2
0
1
10
100
TOTAL DOSE KRAD (Si)
1000
RH1014M G01
0
1
10
100
TOTAL DOSE KRAD (Si)
1000
RH1014M G02
0
1
10
100
TOTAL DOSE KRAD (Si)
1000
RH1014M G03
Rev. H
4
For more information
LINER [ LINEAR TECHNOLOGY ]
