Specifications
GAL22V10D
Specifications
GAL22V10
AC Switching Characteristics
Over Recommended Operating Conditions
COM / IND
PARAM.
TEST
COND.
1
COM / IND
IND
COM / IND
DESCRIPTION
Input or I/O to Comb. Output
Clock to Output Delay
Clock to Feedback Delay
Setup Time, Input or Fdbk before Clk↑
Hold Time, Input or Fdbk after Clk↑
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
Maximum Clock Frequency with
No Feedback
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
Input or I/O to Output Disabled
Input or I/O to Asynch. Reset of Reg.
Asynch. Reset Pulse Duration
Asynch. Reset to Clk↑ Recovery Time
Synch. Preset to Clk↑ Recovery Time
1
1
—
6
0
-10
-15
-20
-25
UNITS
ns
ns
ns
ns
ns
MHz
MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX.
10
7
2.5
—
—
—
3
2
—
10
0
55.5
15
8
2.5
—
—
—
3
2
—
12
0
41.6
20
10
8
—
—
—
3
2
—
15
0
33.3
25
15
13
—
—
—
t
pd
t
co
t
cf
2
t
su
t
h
A
A
—
—
—
A
83.3
f
max
3
A
A
110
125
—
—
80
83.3
—
—
45.4
50
—
—
35.7
38.5
—
—
MHz
MHz
t
wh
t
wl
t
en
t
dis
t
ar
t
arw
t
arr
t
spr
—
—
B
C
A
—
—
—
4
4
1
1
1
8
8
8
—
—
10
9
13
—
—
—
6
6
3
3
3
15
10
10
—
—
15
15
20
—
—
—
10
10
3
3
3
20
20
14
—
—
20
20
25
—
—
—
13
13
3
3
3
25
25
15
—
—
25
25
25
—
—
—
ns
ns
ns
ns
ns
ns
ns
ns
1) Refer to
Switching Test Conditions
section.
2) Calculated from
fmax
with internal feedback. Refer to
fmax Description
section.
3) Refer to
fmax Description
section.
Capacitance (T
A
= 25°C, f = 1.0 MHz)
SYMBOL
C
I
C
I/O
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
8
8
UNITS
pF
pF
TEST CONDITIONS
V
CC
= 5.0V, V
I
= 2.0V
V
CC
= 5.0V, V
I/O
= 2.0V
*Characterized but not 100% tested.
8
LATTICE [ LATTICE SEMICONDUCTOR ]
