Specifications GAL20VP8
(1)
Absolute Maximum Ratings
Recommended Operating Conditions
Supply voltage VCC ........................................ –.5 to +7V
Input voltage applied .......................... –2.5 to VCC +1.0V
Off-state output voltage applied ......... –2.5 to VCC +1.0V
Storage Temperature ................................ –65 to 150°C
Ambient Temperature with
Commercial Devices:
Ambient Temperature (TA) ............................... 0 to 75°C
Supply voltage (VCC)
with Respect to Ground ..................... +4.75 to +5.25V
Power Applied ........................................... –55 to 125°C
1. Stresses above those listed under the “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress only ratings and functional operation of the device
at these or at any other conditions above those indicated in
the operational sections of this specification is not implied
(while programming, follow the programming specifications).
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL
PARAMETER
CONDITION
MIN.
TYP.4
MAX. UNITS
VIL
VIH
VI1
Input Low Voltage
Vss – 0.5
2.0
—
—
—
0.8
Vcc+1
–1.2
–100
10
V
V
Input High Voltage
Input Clamp Voltage
Vcc = Min. IIN = –32mA
0V ≤ VIN ≤ VIL (MAX.)
V
IIL2
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
Output Low Voltage
—
—
—
—
—
—
—
—
µA
µA
V
IIH
3.5V ≤ VIN ≤ VCC
—
VOL
VOH
IOL
IOH
IOS3
IOL = MAX. Vin = VIL or VIH
IOH = MAX. Vin = VIL or VIH
—
0.5
Output High Voltage
2.4
—
—
V
Low Level Output Current
High Level Output Current
Output Short Circuit Current
64
mA
mA
mA
—
–32
–400
VCC = 5V VOUT = 0.5V TA = 25°C
–60
COMMERCIAL
ICC
Operating Power
Supply Current
1) Characterized but not 100% tested.
2) The leakage current is due to the internal pull-up resistor on all pins. See Input Buffer section for more information.
VIL = 0.5V VIH = 3.0V
L -15/-25
—
90
115
mA
ftoggle = 15MHz Outputs Open
3) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems by tester ground
degradation. Characterized but not 100% tested.
4) Typical values are at Vcc = 5V and TA = 25 °C
10
LATTICE [ LATTICE SEMICONDUCTOR ]
