SpSepceifcicifaictaiotniosnGs AGLA2L02V08VC8
AC Switching Characteristics
Over Recommended Operating Conditions
COM
-5
COM
-7
COM/IND
-10
TEST
DESCRIPTION
PARAMETER
UNITS
COND1.
MIN. MAX.
MIN. MAX.
MIN. MAX.
tpd
A
Input or I/O to
Comb. Output
8 outputs switching
1 output switching
1
5
3
7.5
7
3
10
—
ns
ns
—
—
—
—
tco
tcf2
tsu
th
A
Clock to Output Delay
1
—
3
4
3
2
—
5
5
3
2
7
6
ns
ns
ns
—
—
Clock to Feedback Delay
—
Setup Time, Input or Feedback before Clock↑
Hold Time, Input or Feedback after Clock↑
—
—
—
7.5
—
—
A
0
0
—
—
0
—
—
ns
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
142.8 —
100
66.7
MHz
fmax3
A
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
166
166
—
—
125
125
—
—
71.4
83.3
—
—
MHz
MHz
Maximum Clock Frequency with
No Feedback
twh
twl
—
—
Clock Pulse Duration, High
Clock Pulse Duration, Low
3
3
—
—
4
4
—
—
6
6
—
—
ns
ns
ten
B
B
Input or I/O to Output Enabled
OE to Output Enabled
1
1
6
6
3
2
9
6
3
2
10
10
ns
ns
tdis
C
C
Input or I/O to Output Disabled
OE to Output Disabled
1
1
5
5
2
9
6
2
10
10
ns
ns
1.5
1.5
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
3) Refer to fmax Descriptions section. Characterized initially and after any design or process changes that may affect these
parameters.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
UNITS
pF
TEST CONDITIONS
VCC = 5.0V, VI = 2.0V
VCC = 5.0V, VI/O = 2.0V
CI
8
8
CI/O
pF
*Characterized but not 100% tested
12
LATTICE [ LATTICE SEMICONDUCTOR ]
