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GAL16VP8B-25LP 参数 Datasheet PDF下载

GAL16VP8B-25LP图片预览
型号: GAL16VP8B-25LP
PDF下载: 下载PDF文件 查看货源
内容描述: 高速E2CMOS PLD通用阵列逻辑 [High-Speed E2CMOS PLD Generic Array Logic]
分类和应用: 可编程逻辑器件光电二极管输入元件时钟
文件页数/大小: 17 页 / 214 K
品牌: LATTICE [ LATTICE SEMICONDUCTOR ]
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Specifications GAL16VP8  
fmax Descriptions  
CLK  
LOGIC  
ARRAY  
CLK  
REGISTER  
LOGIC  
ARRAY  
REGISTER  
t
su  
tco  
fmax with External Feedback 1/(tsu+tco)  
Note: fmax with external feedback is calculated  
from measured tsu and tco.  
t
cf  
pd  
t
fmax with Internal Feedback 1/(tsu+tcf)  
CLK  
Note: tcf is a calculated value, derived by sub-  
tracting tsu from the period of fmax w/internal  
feedback (tcf = 1/fmax - tsu). The value of tcf  
LOGIC  
REGISTER  
ARRAY  
is used primarily when calculating the delay from  
clocking a register to a combinatorial output  
(through registered feedback), as shown above.  
For example, the timing from clock to a combi-  
t
su + th  
natorial output is equal to tcf + tpd.  
fmax with No Feedback  
Note: fmax with no feedback may be less than 1/(twh + twl). This  
is to allow for a clock duty cycle of other than 50%.  
Switching Test Conditions  
+5V  
Input Pulse Levels  
GND to 3.0V  
3ns 10% 90%  
1.5V  
Input Rise and Fall Times  
Input Timing Reference Levels  
Output Timing Reference Levels  
R
1
1.5V  
Output Load  
See Figure  
3-state levels are measured 0.5V from steady-state active  
level.  
FROM OUTPUT (O/Q)  
UNDER TEST  
TEST POINT  
Output Load Conditions (see figure)  
Test Condition  
R1  
R2  
CL  
C L*  
R
2
A
B
500Ω  
500Ω  
500Ω  
500Ω  
500Ω  
500Ω  
500Ω  
50pF  
50pF  
50pF  
5pF  
Active High  
Active Low  
Active High  
Active Low  
C
500Ω  
5pF  
*C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE  
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