Specifications
ispLSI 2096VL
Switching Test Conditions
Input Pulse Levels
Input Rise and Fall Time
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
3-state levels are measured 0.15V from
steady-state active level.
GND to V
CC
≤
1.5ns 10% to 90%
V
CC
/2
V
CC
/2
See Figure 2
Table 2-0003/2096VL
Figure 2. Test Load
V
CC
R1
Device
Output
R2
CL
*
Test
Point
Output Load Conditions (see Figure 2)
TEST CONDITION
A
B
Active High
Active Low
Active High to Z
at
V
OH
-0.15V
Active Low to Z
at
V
OL
+0.15V
R1
250Ω
R2
218Ω
218Ω
CL
35pF
35pF
35pF
5pF
5pF
∞
250Ω
∞
250Ω
*
CL includes Test Fixture and Probe Capacitance.
0213A/2096VL
∞
218Ω
C
∞
Table 2-0004/2096VL
DC Electrical Characteristics
Over Recommended Operating Conditions
SYMBOL
PARAMETER
Output Low Voltage
CONDITION
I
OL
= 100µA
I
OL
= 8mA
I
OH
= -100µA
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
BSCAN
Input Pull-Up Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
I
OH
= -1mA
I
OH
= -4mA
0V
≤
V
IN
≤
V
IL
(Max.)
V
IH
(min)
≤
V
IN
≤
3.6V
0V
≤
V
IN
≤
V
IL
0V
≤
V
IN
≤
V
IL
V
CC
= 2.5V, V
OUT
= 0.5V
V
IL
= 0.0V, V
IH
= 2.5V
f
CLK
= 1 MHz
Table 2-0007/2096VL
1. One output at a time for a maximum duration of one second. V
OUT
= 0.5V was selected to avoid test
problems by tester ground degradation. Characterized but not 100% tested.
2. Measured using six 16-bit counters.
3. Typical values are at V
CC
= 2.5V and T
A
= 25°C.
4. Maximum I
CC
varies widely with specific device configuration and operating frequency. Refer to Power Consumption
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
estimate maximum I
CC
.
5. With no pull-up resistors.
MIN.
—
—
V
CC
- 0.2
TYP.
—
—
—
—
—
—
—
—
—
—
85
3
MAX. UNITS
0.2
0.4
—
—
—
-10
10
-150
-150
-100
—
V
V
V
V
V
µA
µA
µA
µA
mA
mA
V
OL
V
OH
I
IL
5
I
IH
I
IL-isp
I
IL-PU
I
OS
1
I
CC
2, 4
2.0
1.8
—
—
—
—
—
—
4