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CM05X7R223K16AH 参数 Datasheet PDF下载

CM05X7R223K16AH图片预览
型号: CM05X7R223K16AH
PDF下载: 下载PDF文件 查看货源
内容描述: 多层陶瓷芯片电容器 [Multilayer Ceramic Chip Capacitors]
分类和应用: 电容器
文件页数/大小: 16 页 / 163 K
品牌: KYOCERA AVX [ KYOCERA AVX ]
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Multilayer Ceramic Chip Capacitors  
Test Conditions and Standards  
Test conditions and Specification for Temperature Compensation type(C to U • SL characteristics)  
Test Items  
Capacitance Value  
Q
Specification (C: nominal capacitance)  
Within tolerance  
Test Conditions  
C1000pF  
1MHz±10%  
1kHz±10%  
0.5 to  
C30pF: Q1000  
C>1000pF  
5Vrms  
C<30pF: Q400+20C  
Measured after the rated voltage is applied for one  
minute at normal room temperature and humidity. ( 4)  
Insulation resistance (IR)( 6) 10,000Mor 500MµF min, whichever is less  
( 1) Apply 3 times of the rated voltage for 1 to 5 seconds.  
( 6)  
Dielectric Resistance  
Appearance  
No problem observed  
No problem observed  
Microscope(10×magnification)  
Apply a sideward force of 500g(5N) ( 7) to a PCB-mounted  
sample.  
( 2)  
( 2)  
Termination strength  
Bending strength  
No problem observed  
Glass epoxy PCB (t=1.6mm); fulcrum  
Spacing: 90mm; for 10 seconds.  
No mechanical damage at 1mm bent  
No significant change is detected.  
Within tolerance  
Vibration  
test  
Appearance  
Vibration frequency: 10 to 55(Hz)  
Amplitude: 1.5mm  
Sweeping condition: 105510Hz/min  
In X, Y and Z directions:  
C  
C30pF: Q1000  
Q
2 hours each Total 6 hours  
C<30pF: Q400+20C  
Soak the sample in 260°C±5°C  
solder for 10±0.5seconds  
and place in a room at normal temperature  
and humidity; measure after 24±2hours.  
(Preheating Conditions)  
Soldering  
heat  
resistance  
Appearance  
No significant change is detected.  
C  
±2.5% or ±0.25pF max, whichever is larger.  
C30pF: Q1000  
Q
C<30pF: Q400+20C  
Order  
Temperature  
80 to 100°C  
150 to 200°C  
Time  
( 6)  
IR  
10,000Mor 500MµF min, whichever is smaller  
1
2
2minutes  
2minutes  
Withstand voltage  
Resists without problem  
( 6)  
Soaking Condition  
Solderability  
Ni/Br termination: 90% min  
Sn63 Solder  
235±5°C  
2±0.5sec.  
3±0.5sec.  
Sn-3Ag-0.5Cu 245±5°C  
Temperature  
cycle ( 3)  
Appearance  
No significant change is detected.  
(Cycle)  
Normal room temperature (3min)→  
Lowest operation temperature (30min)→  
Normal room temperature (3min)→  
Highest operation temperature (30min)→  
C  
±2.5% or ±0.25pF max, whichever is larger.  
C30pF: Q1000  
Q
C<30pF: Q400+20C  
( 6)  
IR  
10,000Mor 500MµF min, whichever is samller  
Resists without problem  
After five cycles ( 3), measure after  
24±2hours.  
Withstand voltage  
( 6)  
Humidity  
Appearance  
No significant change is detected.  
Measure the test sample after storing it  
24±2hours at a temperature of 40°C±2°C  
and a relative humidity of 90-95% Rh.  
for 500+24/0hours.  
test  
( 5)  
C  
±7.5% or ±0.75pF max, whichever is larger.  
C30pF: Q200  
Q
C<30pF: Q100+10C/3  
( 6)  
IR  
500Mor 25MµF min, whichever is smaller  
No significant change is detected.  
After applying ( 1) twice of the rated voltage  
at a temperature of 125±3°C for  
1000+48/0hours, measure the sample  
after storing 24±2hours.  
High-  
Appearance  
temperature  
with  
C  
±3% or ±0.3pF max, whichever is larger.  
loading  
C30pF: Q350  
Q
10pFC<30pF: Q275+5C/2  
C<10pF: Q200+10C  
( 6)  
IR  
1,000Mor 50MµF min, whichever is smaller  
1
For the CF series, use 1.5 times when the rated voltage is 250V; use/1.2 times when  
the rated voltage exceeds 630V.  
Except CT series  
Different specification for Nickel Barrier termination DN/DR series. (Alumina Substrate)  
Apply 500V for 1minite in case the rated voltage is 1000V or higher.  
5
6
7
Except CF series.  
The charge and discharge current of the capacitor must not exceed 50mA.  
2N at 0201 Size  
2
3
4