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N5393E 参数 Datasheet PDF下载

N5393E图片预览
型号: N5393E
PDF下载: 下载PDF文件 查看货源
内容描述: [Infiniium Oscilloscopes]
分类和应用:
文件页数/大小: 25 页 / 3491 K
品牌: KEYSIGHT [ Keysight Technologies ]
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16 | Keysight | N5393D PCI Express® 3.0 (Gen3) Software for Infiniium Oscilloscopes - Data Sheet  
Reference Clock Measurements  
The PCI Express 1.0a specification  
failed to specify the input bandwidth  
the reference clock receiver or phase  
jitter of the reference clock itself. This is  
important because jitter that lies within  
the loop bandwidth the receiver PLL for  
the reference clock will transfer onto the  
high speed data lines. This hole in the PCI  
Express specification was corrected in the  
1.1 update.  
InfiniiMax 1169A probe with  
E2678A socket adapter  
attached to CLB  
Note 2pF capacitors added  
to CLB to create REFCLK  
compliance load as per spec  
The N5393D includes powerful reference  
clock evaluation tools including phase  
jitter. The PCIe 1.1 specification calls  
for a very specific phase jitter filter that  
focuses the measurement on the jitter that  
lies between 1.5 and 22-MHz. The filter  
also amplifies the jitter 3 dB (peaking)  
within this region. The Keysight N5393D  
includes proprietary filtering software  
(patent pending) that exactly implements  
the filters specified in the PCI Express  
specification. The N5393D also includes  
reference clock tests based on the PCIe  
2.0 and 3.0 specification.  
Figure 22. The N5393D software includes important tests for the reference clock of your  
PCI Express system. This signal can be probed using the Keysight InfiniiMax 1169A probes in  
conjunction with the PCI-SIG’s compliance load board.  
Utilizing Keysight’s InfiniiMax 1169A high  
performance differential probes, or direct  
cabled connections, you can measure  
your reference clock using the PCI-SIG’s  
Compliance Load Board or custom test  
fixture.  
Reference clock test connection using CLB2  
Reference clock tests  
Phase jitter  
Rising edge rate  
Falling edge rate  
Differential input high voltage  
Differential input low voltage  
Average clock period  
Duty cycle  
Figure 23. This shows the CLB2 inserted into the CBB2 test fixture, representing the setup required  
to test add-in cards.  
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