08 | Keysight | N1090A, N1092A/B/C/D/E and N1094A/B DCA-M Optical and Electrical Sampling Oscilloscopes - Data Sheet
N1092/4 Configurations
The N1092/4 models have the following options available.
Option
Description
Option 168
Option 206
Option FS1
Option LOJ
Option PLK
Option IRC
25.78 Gb/s TDEC filter (100GBASE-SR4) (not available with the N1094)
20.6 Gb/s reference receiver (not available with the N1094)
Increase sampling rate from 100 to 250 kSa/s
Reduce residual jitter from 400 to < 200 fs
Add pattern lock capability
Extend optical channel bandwidth to 45 GHz and allow creation of reference receiver
filters at any data rate from 8 to 42 Gb/s (not available with the N1094)
Advanced jitter analysis. Provides extensive and accurate jitter decomposition,
which is increasingly important as data rates increase and margins reduce. Quickly
customize your view of many parameters and take advantage of advanced features
such as jitter spectrum analysis
Option 200
Option 201
Option 300
Option 401
Advanced waveform analysis. Its powerful features allow you to generate much
deeper waveform files, integrate MATLAB analysis, and use the built-in linear
feed-forward equalizer
Advanced amplitude/noise analysis. Extends jitter mode capabilities into the
amplitude domain and allows you to see the decomposition of the amplitude into
several factors. Option 300 also reports relative intensity noise (RIN) and Q-factor
Advanced eye analysis. For device testing with long patterns and obtaining BER-
contour mask testing, Option 401 integrates with the classic or FlexDCA interfaces
to decompose the jitter and amplitude interference measurements into the key
parameters. When using the embedded capability within FlexDCA or the included
automation application, you may characterize jitter on simultaneous multiple lanes
and obtain concise and visual results
Option 500
Option 9FP
Productivity package (Rapid eye, TDEC). Enables rapid eye acquisition, providing two
significant benefits. First, unlike conventional sampling and data display, when an eye
mask test is performed, every acquired sample will be compared to the mask, as the
central eye is composed of all acquired samples. Effective throughput is improved
at least 60 percent. Second, incomplete eye diagram displays that can occur when
triggering at sub-rates are eliminated. Option 500 also includes the TDEC analysis
required for 100GBASE-SR4 test
PAM-N analysis. Eye width, eye height, eye skew, level amplitude, level noise, level
skew, and linearity measurements
Option SIM
Option 030
Option 050
Infinisim Waveform Transformation software
Configure electrical channels with a 30 GHz bandwidth (not available with the N1092)
Configure electrical channels with a 50 GHz bandwidth (N1092C/E have standard
50 GHz bandwidths for the electrical channels)
The N1092C and N1092E electrical channels have 50 GHz bandwidths that can be reduced by
the user to 20, 33 and 40 GHz. Note that operation of Options 200, 201, 300, 401, 500, 9FP, and
SIM can be achieved by having the appropriate licenses installed on the N1092, the computer
controlling the N1092, or an 86100 mainframe used to control the N1092.
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