26 | Keysight | Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Data Sheet
Measurements (Continued)
Option 500 productivity package including TDEC
– Time at max
– Time at min
– Time at amplitude
Option 500 enables Rapid Eye acquisition and TDEC (transmitter
dispersion and eye closure) measurements. Rapid Eye achieves
two significant benefits. First, unlike conventional sampling
and data display, when an eye mask test is performed, every
acquired sample will be compared to the mask, as the central
eye is composed of all acquired samples. Effective throughput is
improved at least 60%. Second, incomplete eye diagram displays
that can occur when triggering at sub-rates are eliminated. TDEC
is a complex eye diagram measurement required for new high
data rate standards deployed over multimode fiber. It is easily
and quickly achieved with the automated TDEC measurement.
(IEEE 802.3bm and T11 FC-PI-6P require a specific TDEC channel
bandwidth, achieved with 86105D/86115D-Option 168.)
– Limit lines
– Time at edge
Additional capabilities
Standard functions
– Standard functions are available through pull down menus
and soft keys, and some functions are also accessible
through the front panel knobs.
Markers
– Two vertical and two horizontal (user-selectable)
Option 401 advanced EYE analysis
Limit tests
– Acquisition limits
– Limit test “Run Until” conditions — Off, # of Waveforms, # of
Samples
– Report action on completion — Save waveform to memory,
save screen image
– Jitter measurements
Total jitter (TJ), random jitter (RJ), deterministic jitter (DJ), J2
jitter (J2), J5 jitter (J5), J9 jitter (J9)
– Amplitude measurements
Total interference (TI), random noise (RN), deterministic
interference (DI), eye opening
– Measurement limit test
– Mask test
Pass/fail status, BER limit
– Specify number of failures to stop limit test
– When to fail selected measurement — Inside limits, outside
limits, always fail, never fail
– Report action on failure — Save waveform to memory, save
screen image, save summary
Option SIM InfiniiSim-DCA
2-port de-embedding and embedding; 4-port de-embedding and
embedding; add simulated random jitter and noise
– Mask limit test
– Specify number of failed mask test samples
– Report action on failure — Save waveform to memory, save
screen image, save summary
Option 9FP PAM-N analysis software
– Electrical and optical signals
– Eye width, eye height, eye skew
– Level amplitude, level noise, level skew
– Linearity measurements
Limit lines
– With the limit line editor, you can modify an existing limit line
or create a new limit line from a current waveform or manual
data entry.
– Limit lines are displayed boundaries used for pass/fail testing
in oscilloscope and TDR/TDT instrument modes, and they
are similar to masks in Eye/Mask mode.
– TDECQ, Outer OMA, Outer ER
Option TFP IEEE TDEFCQ Analysis software
– TDECQ, Outer OMA, Outer ER
– Any data point that occurs above an upper limit line or below
a lower limit line causes a failed condition. A failed portion of
a waveform that is beyond the limit line boundary is displayed
in red.
TDR/TDT mode (requires TDR module)
Some also usable within measurement regions:
Prior to average add:
– Time domain responses available in volts, percent reflection
and ohms (where applicable)
– X-axis in time or distance
– Average
Waveform autoscaling
Autoscaling provides quick horizontal and vertical scaling of both
pulse and eye-diagram (RZ and NRZ) waveforms.
– Min
– Max
– Amplitude at time
– Excess capacitance
– Excess inductance
– Rise time
– Fall time
– Delta time
Gated triggering
Trigger gating port allows easy external control of data
acquisition for circulating loop or burst-data experiments. Use
TTL-compatible signals to control when the instrument does and
does not acquire data.
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