06 | Keysight | M9195B PXIe Digital Stimulus/Response with PPMU: 250 MHz, 16-channel - Data Sheet
Standard Test Interface Language (STIL) Support
The PXI DSR takes advantage of the Standard Test Interface language (STIL) IEEE Std
1450.0 which was designed for ATE testing. The PXI DSR can be configured using STIL
commands that specify signal grouping, patterns, format, and timing information used to
apply digital test vectors to a device being tested. Using a simple text editor and using
the STIL format, attributes needed to generate digital patterns can quickly be created.
STIL tests are easy to read and understand which simplifies test development and
debug. Either the IVI API or the SFP can execute tests developed in STIL.
Bulk data import
The PXI DSR supports bulk data file import to load legacy and tool generated patterns.
Bulk data import utilizes simple text files where the first row contains signal names and
provides the option to a reference a waveform table. Each subsequent row represents
the vectors which make up the patterns. The waveform table itself can be defined using
the SFP, IVI driver, or STIL file. This provides a quick and easy way to develop production
tests using patterns developed in R&D.
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