02 | Keysight | M9195B PXIe Digital Stimulus/Response with PPMU: 250 MHz, 16-channel - Data Sheet
Overview
Experience high speed digital test capabilities at a whole new level. The Keysight
Technologies, Inc. M9195B PXIe Digital Stimulus/Response (PXI DSR) module is ideal
for IC design validation and production test environments. It goes beyond providing just
standard capabilities. The new 16-channel, single slot PXI module introduces a high
performance pattern cyclizer for powerful pattern creation including advanced timing
capabilities such as multiple drive edges per cycle. This provides flexible edge placement
and stimulus/response delays for timing margin testing or cable length compensation.
Additionally, it can support up to four independent multi-sites with an independent
sequencer for each site.
Software tools included with the M9195B allow the user to modify vector and pattern
parameters without requiring the user to recompile and download tests. An optional set
of digital development tools are also available. These software tools include a graphical
pattern editor and pattern conversion tools to speed test development by enabling test
patterns from various EDA systems to be read in, edited, and output to the M9195B.
Additonal ATE features include:
– High speed pattern application and RZ (Return-to-Zero) clock rate up to 250 MHz
– Per pin programming of voltage levels
– Real time compare, parametric measurement unit (PPMU)
– Deep vector memory and flexible pattern sequencing
With the PXI DSR module you can easily emulate standard serial interfaces like the MIPI®
RF Front-End interface or proprietary parallel device interfaces. The test development
software tools enable you to quickly create and edit waveform patterns or to import
patterns created by automatic test generation applications.
Applications
– RFFE bus emulation used in PA/FEM semiconductor device verification or
production test
– Wireless communication devices using parallel or serial digital control
– Automated test in product validation or manufacturing test
– Backplane emulation for device, board, or module testing
– Digital serial and parallel applications
Key features
– Combine modules to form systems of up to 192 channels (requires option MMS).
– 16 bidirectional channels with per-pin programmable logic levels
– Highly flexible, per-bit timing control for fast and accurate waveform development
– Reconfigurable per-pin Parametric Measurement Unit (PPMU) for each channel
– Single and multi-site configurations
– Edit patterns on-the-fly without recompiling and downloading the test
– Execute patterns in arbitrary order
– Flexible allocation of deep pattern memory per channel or per site to allocate
memory where it is needed
– Channel delay adjustment to compensate for cable and fixture propagation delays
– 4 high voltage channels for flash programming or fuse test
– 4 open drain auxillary output pins for fixture relays
– Hardware triggers and markers for test system synchronization
– Comprehensive software tool set for quick test development
KEYSIGHT [ Keysight Technologies ]
