02 | Keysight | M9195A PXIe Digital Stimulus/Response with PMU: 250 MHz, 16-channel - Data Sheet
Overview
Experience high speed digital test capabilities at a whole new level. The Keysight
Technologies, Inc. M9195A PXIe Digital Stimulus/Response (PXI DSR) module is ideal
for IC design validation and production test environments. It goes beyond providing just
standard capabilities. The new 16-channel, single slot PXI module introduces a high
performance pattern cyclizer for powerful pattern creation including advanced timing
capabilities such as multiple drive edges per cycle. This provides flexible edge placement
and stimulus/response delays for timing margin testing or cable length compensation.
Additionally, it can support up to four independent multi-sites with an independent se-
quencer for each site. Software tools included with the M9195A allow the user to modify
vector and pattern parameters without requiring the user to recompile and download
tests.
Additonal ATE features include:
– High speed pattern application and RZ (Return-to-Zero) clock rate up to 250 MHz
– Per pin programming of voltage levels
– Real time compare, parametric measurement unit (PMU)
– Deep vector memory and flexible pattern sequencing
With the PXI DSR module you can easily emulate standard serial interfaces like the
MIPI™ RF Front-End interface or proprietary parallel device interfaces. The test devel-
opment software tools enable you to quickly create and edit waveform patterns or to
import patterns created by automatic test generation applications.
Applications
– RFFE bus emulation used in PA/FEM semiconductor device verification or
production test
– Wireless communication devices using parallel or serial digital control
– Automated test in product validation or manufacturing test
– Backplane emulation for device, board, or module testing
– Digital serial and parallel applications
Key features
– 16 bidirectional channels with per-pin programmable logic levels
– Highly flexible, per-bit timing control for fast and accurate waveform development
– Reconfigurable per-pin Parametric Measurement Unit (PMU) for each channel
– Single and multi-site configurations
– Edit patterns on-the-fly without recompiling and downloading the test
– Execute patterns in arbitrary order
– Flexible allocation of deep pattern memory per channel or per site to allocate
memory where it is needed
– Channel delay adjustment to compensate for cable and fixture propagation delays
– 4 high voltage channels for flash programming or fuse test
– 4 open drain auxillary output pins for fixture relays
– Comprehensive software tool set for quick test development
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