19 | Keysight | InfiniiVision 6000 X-Series Oscilloscopes - Data Sheet
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Optional mask/limit testing
Whether you are performing pass/fail tests to specified standards
in manufacturing or testing for infrequent signal anomalies,
mask/limit testing (Option DSOX6MASK) can be a valuable
productivity tool. The 6000 X-Series features powerful hardware-
based mask testing and can perform up to 130,000 tests per
second. You can select multiple test criteria, including the ability
to run tests for a specific number of acquisitions, a specified time,
or until detection of a failure. You can set the 6000 X-Series to
beep when the mask fails.
Figure 41. Mask testing of serial data.
Find events faster with search and navigation
features
Parametric and serial bus search and navigation features come
standard on the 6000 X-Series oscilloscopes. When you are
capturing long, complex waveforms using an oscilloscope’s
acquisition memory, manually scrolling through stored waveform
data to find specific events of interest can be slow and
cumbersome. With automatic search, navigation, and listing,
you can easily set up specific search criteria and then quickly
navigate to “found and marked” events. Available search criteria
include edges, pulse width (time-qualified), rise/fall times (time-
qualified), runt pulses (time- and level-qualified), frequency peaks
(up to 11 peaks), and serial bus frames, packets, and errors. The
side-bar lister gives you an overview of the time tag of each found
event relative to the trigger location.
Figure 42. Searching for and navigating to a specific pulse width.
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