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DSOX6B10T252BW 参数 Datasheet PDF下载

DSOX6B10T252BW图片预览
型号: DSOX6B10T252BW
PDF下载: 下载PDF文件 查看货源
内容描述: [InfiniiVision 6000 X-Series Oscilloscopes]
分类和应用:
文件页数/大小: 45 页 / 3290 K
品牌: KEYSIGHT [ Keysight Technologies ]
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19 | Keysight | InfiniiVision 6000 X-Series Oscilloscopes - Data Sheet  
New Standard for Price Performance: Bandwidth, Visualization, and Integration  
Integration (Continued)  
Optional mask/limit testing  
Whether you are performing pass/fail tests to specified standards  
in manufacturing or testing for infrequent signal anomalies,  
mask/limit testing (Option DSOX6MASK) can be a valuable  
productivity tool. The 6000 X-Series features powerful hardware-  
based mask testing and can perform up to 130,000 tests per  
second. You can select multiple test criteria, including the ability  
to run tests for a specific number of acquisitions, a specified time,  
or until detection of a failure. You can set the 6000 X-Series to  
beep when the mask fails.  
Figure 41. Mask testing of serial data.  
Find events faster with search and navigation  
features  
Parametric and serial bus search and navigation features come  
standard on the 6000 X-Series oscilloscopes. When you are  
capturing long, complex waveforms using an oscilloscope’s  
acquisition memory, manually scrolling through stored waveform  
data to find specific events of interest can be slow and  
cumbersome. With automatic search, navigation, and listing,  
you can easily set up specific search criteria and then quickly  
navigate to “found and marked” events. Available search criteria  
include edges, pulse width (time-qualified), rise/fall times (time-  
qualified), runt pulses (time- and level-qualified), frequency peaks  
(up to 11 peaks), and serial bus frames, packets, and errors. The  
side-bar lister gives you an overview of the time tag of each found  
event relative to the trigger location.  
Figure 42. Searching for and navigating to a specific pulse width.  
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