40 | Keysight | B1505A Power Device Analyzer/Curve Tracer - Data Sheet
Oscilloscope view
Application library
Measurement modes:
The oscilloscope view (available in tracer
test mode) displays measured current
or voltage data versus time. The pulsed
measurement waveforms appear in a
separate window for easy verification of
the measurement timings. This function
is useful for verifying waveform timings
and debugging pulsed measurements.
The following modules are supported in
this view: HCSMU, MCSMU, HVSMU,
UHCU, HVMCU, and UHVU. The oscil-
loscope view can display the pulsed
waveform timings at any (user specified)
sweep step of the sweep output.
The Keysight B1505A supports the
following measurement modes:
EasyEXPERT group+ comes with over 40
application tests conveniently organized
by device type, application, and technol-
ogy. You can easily edit and customize
the furnished application tests to fit your
specific needs. Application tests are pro-
vided for the following categories; they are
subject to change without notice.
– IV measurement
– Spot
– Staircase sweep
– Pulsed spot
– Pulsed sweep
– Staircase sweep with pulsed bias
– Sampling
– Multi-channel sweep
– Multi-channel pulsed sweep
– List sweep
Measurement modes
and functions
– Linear search1
– Binary search1
– C measurement
– Spot C
Operation mode:
Application test mode
Sampling interval:
2 μs (HCSMU/MCSMU/UHCU/
HVMCU/UHVU)
The application test mode provides
application oriented point-and-click
test setup and execution. An application
test can be selected from the library by
device type and desired measurement,
and then executed after modifying the
default input parameters as needed.
– CV (DC bias) sweep
– Pulsed spot C
– Pulsed sweep CV
– C-t sampling
– C-f sweep
– CV (AC level) sweep
6 μs (HVSMU)
Sampling points:
2000 Sa (HCSMU/MCSMU/
UHCU/HVMCU/UHVU)
4000 Sa (HVSMU)
– Quasi-Static CV (QSCV)
1. Supported only by FLEX commands.
Classic test mode
Marker function:
The classic test mode provides function
oriented test setup and execution with
the same look, feel, and terminology of
the 4155/4156 user interface. In addi-
tion, it improves the 4155/4156 user
interface by taking full advantage
of EasyEXPERT group+’s GUI features.
Read-out for each data channel
Resolution: 2 μs
Sweep measurement
Number of steps: 1 to 10001 (SMU),
1 to 1001 (CMU)
Sweep mode: Linear or logarithmic
(log)
Data saving:
Numeric: Text/CSV/XMLSS
Image: EMF/BMP/JPG/PNG
Sweep direction: Single or double
sweep
Quick test mode
A GUI-based Quick Test mode enables
you to perform test sequencing without
programming. You can select, copy, rear-
range and cut-and-paste any application
tests with a few simple mouse clicks.
Once you have selected and arranged
your tests, simply click
Hold time:
0 to 655.35 s, 10 ms resolution
Tracer test mode
The tracer test mode offers intuitive and
interactive sweep control using a rotary
knob similar to a curve tracer. Just like
an analog curve tracer, you can sweep in
only one direction (useful for R&D device
analysis) or in both directions (useful in
failure analysis applications). Test set ups
created in tracer test mode can be seam-
lessly and instantaneously transferred
to classic test mode for further detailed
measurement and analysis.
on the measurement button to begin
running an automated test sequence.
Recommended GPIB I/F
Each SMU can sweep using VAR1 (pri-
mary sweep), VAR2 (secondary sweep),
or VAR1’ (synchronous sweep).
Interface
B1505A
1
82350B
82357A
82357B
PCI
2
2
2
USB
USB
USB
Keysight
National Instrument GPIB-USB-HS
1. An 82350B card is highly recommended because of stability and speed.
2. USB GPIB interfaces might cause serial poll error intermittently due to the intrinsic communi-
cation scheme differences. It is reported that using an even GPIB address sometimes significantly
decreases the chance of the error. The NI GPIB-USB-HS is recommended for stability, and the
Keysight 82357B is recommended for speed.
KEYSIGHT [ Keysight Technologies ]
