Introduction
The Keysight Technologies, Inc. B1505A Power Device Analyzer/Curve Tracer is a
single-box solution with next-generation curve tracer functionality that can ac-
curately evaluate and characterize power devices at up to 10 kV and 1500 A. The
B1505A is capable of handling all types of power device evaluation, with features
that include a wide voltage and current range, fast pulsing capability (10 µs), µΩ
level on-resistance measurement resolution and sub-pA level current measure-
ment capability. In addition, an oscilloscope view permits visual verification of
both current and voltage pulsed waveforms.
Two independent analog-to-digital (A/D) converters on each channel support a
2 µs sampling rate for accurate monitoring of the critical timings that can affect
device behavior.
It can also perform fully automated capacitance measurements (such as Ciss,
Coss and Crss) at high voltage biases (up to 3 kV). Moreover, it can evaluate gate
charge (which is an important parameter for high frequency switching converter
efficiency) at up to 3 kV as well. The B1505A with EasyEXPERT group+ software
includes a curve tracer mode that combines familiar curve tracer functionality
with the convenience of a PC-based instrument; this makes it easy for traditional
curve-tracer users to become productive quickly. Module selector, device capaci-
tance selector and Quick Test feature enable fully automated measurement on
multiple parameters without the need to recable. Keysight EasyEXPERT group+
GUI based characterization software is available either on the B1505A’s embed-
ded Windows 7 platform with 15-inch touch screen or on your PC to accelerate
the characterization tasks. It supports efficient and repeatable device charac-
terization in the entire characterization process from measurement setup and
execution to analysis and data management either interactive manual operation
or automation across a wafer in conjunction with a semiautomatic wafer prober.
EasyEXPERT group+ makes it easy to perform complex device characterization
immediately with hundreds of ready-to-use measurements (application tests)
furnished, and allows you the option of storing test condition and measurement
data automatically after each measurement in a unique built-in database (work-
space), ensuring that valuable information is not lost and that measurements can
be repeated at a later date. The net result is improved ease of use, better data
analysis and simplified data management for the measurement of power devices
and power circuitry.